Dong-Ik Kim Byung-Kyu Kim Ju-Heon Kim 2024-01-20T05:31:50Z 2024-01-20T05:31:50Z 2021-09-06 2015-12 2287-5123 https://pubs.kist.re.kr/handle/201004/124666 A technical overview on the various sample preparation methods for electron backscattered diffraction (EBSD) analysis is carried out. The mechanical polishing with colloidal silica f nish, electro-chemical polishing, dual layer coating and ion beam milling are introduced for the common sample preparation methods for EBSD observation and some issues that are frequently neglected by the common EBSD users but should be considered to get a reliable EBSD data are discussed. This overview would be especially helpful to the people who know what EBSD technique is but do not get a reliable EBSD data because of diff culties in sample preparation. English 한국현미경학회 Technical Overview on the Electron Backscattered Diffraction Sample Preparation Article 2 한국현미경학회지, v.45, no.4, pp.218 - 224 한국현미경학회지 45 4 218 224 kci ART002068222 Electron backscattered diffraction Sample preparation Mechanical polishing Electro-chemical polishing Ion milling