Kim, Gee Yeong Jo, William Lee, Kee Doo Choi, Hee-Su Kim, Jin Young Shin, Hae-Young Trang Thi Thu Nguyen Yoon, Seokhyun Joo, Beom Soo Gu, Minseon Han, Moonsup 2024-01-20T06:31:55Z 2024-01-20T06:31:55Z 2022-01-25 2015-08 0927-0248 https://pubs.kist.re.kr/handle/201004/125155 Cu2ZnSnS4 (CZTS) films were grown by electrochemical deposition, and we measured the work function of the as-grown and of the KCN-etched CZTS surfaces by using Kelvin probe force microscopy (KPFM) and micro-Raman scattering spectroscopy with incident laser wavelengths of 488.0 and 632.8 nm, respectively, and the results indicate that a secondary phase formed at different depths. The KPFM measurements can discriminate phase uniformity at the nano-scale. Secondary phases, such as Cu2-xS (0<x< 1), ZnS, and MoS2, were identified on the as-grown surface while Cu2-xS was removed from the KCN-etched surface. The KCN-etched CZTS absorption layer was measured to have a 5.0% conversion efficiency. Owing to the low cost of electrochemical deposition, it is desirable to obtain high tailored CZTS films can be obtained with the robust surface characteristics of a uniform work function with a single phase. (C) 2015 Elsevier B.V. All rights reserved. English ELSEVIER Optical and surface probe investigation of secondary phases in Cu2ZnSnS4 films grown by electrochemical deposition Article 10.1016/j.solmat.2015.03.003 1 SOLAR ENERGY MATERIALS AND SOLAR CELLS, v.139, pp.10 - 18 SOLAR ENERGY MATERIALS AND SOLAR CELLS 139 10 18 N scie scopus 000354585800002 2-s2.0-84925411110 Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Energy & Fuels Materials Science Physics Article THIN-FILMS SOLAR-CELLS GRAIN-BOUNDARIES FORCE MICROSCOPY SULFURIZATION CZTS Cu2ZnSnS4 Electrochemical deposition Work function Secondary phases Kelvin probe force microscopy Raman scattering spectroscopy