Trang Thi Thu Nguyen Shin, Hae-Young Kim, Gee Yeong Kim, Ju Ri Jo, William Yoon, Seokhyun Lee, Ki Doo Kim, Jin Young 2024-01-20T08:01:48Z 2024-01-20T08:01:48Z 2022-01-25 2015-01 0374-4884 https://pubs.kist.re.kr/handle/201004/125885 We used X-ray diffraction (XRD) and Raman scattering spectroscopy to study Cu2ZnSnS4 (CZTS) thin films grown by using an electroplating method. We compared the Raman spectra of the CZTS thin films before and after potassium cyanide (KCN) etching. We observed a phonon mode of the secondary phase Cu2-x S both from Cu-rich and Cu-poor CZTS samples before the KCN etching. We found that the intensity of the Cu2-x S-related vibration mode depended on the excitation wavelength, from which we could estimate the stoichiometry of the Cu2-x S as x = 1. Interestingly, the Cu2-x S phonon is completely removed after the KCN etching. We could also get information regarding the local distribution of the secondary phase on the surfaces of the CZTS thin films by using micro-Raman scattering spectroscopy. English KOREAN PHYSICAL SOC Raman scattering studies of Cu2ZnSnS4 thin films: Local distribution of the secondary phase Cu2-x S and the effect of KCN etching on Cu2-x S Article 10.3938/jkps.66.117 1 JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.66, no.1, pp.117 - 122 JOURNAL OF THE KOREAN PHYSICAL SOCIETY 66 1 117 122 N scie scopus kci 000348139700025 2-s2.0-84921329782 Physics, Multidisciplinary Physics Article SULFURIZATION ABSORBERS CZTS Raman scattering spectroscopy Electroplating KCN etching Secondary phase