Pandey, Rina Angadi, Basavaraj Kim, Seong Keun Choi, Ji Won Hwang, Do Kyung Choi, Won Kook 2024-01-20T08:34:19Z 2024-01-20T08:34:19Z 2021-09-02 2014-10 https://pubs.kist.re.kr/handle/201004/126259 The dielectric/Ag structures were fabricated on glass substrates using various metal oxides as dielectrics and their optical properties were studied through transmittance and ellipsometry measurements. The structures with 10 nm Ag film deposited on various metal oxides (Al2O3, ZrO2, SrTiO3, TiO2, CaCu3Ti4O12, WO3 and HfO2) of 30 nm showed enhancement in transmittance compared to bare Ag film in the visible region. This enhancement in transmittance was explained through suppression of surface plasmon coupling at the dielectric/Ag interface. The surface plasmon wave-vector (kSP) was calculated using the measured dielectric constants for the dielectric and Ag through ellipsometry and employed to analyze the transmittance data. The kSP/k0 and δSP values were estimated and used to interpret the enhanced visible transmittance for different dielectric/Ag structures. English Optical Society of America Fabrication and surface plasmon coupling studies on the dielectric/Ag structure for transparent conducting electrode applications Article 10.1364/OME.4.002078 1 Optical Materials Express, v.4, no.10, pp.2078 - 2089 Optical Materials Express 4 10 2078 2089 N scie scopus 000343405600010 2-s2.0-84907452140 Materials Science, Multidisciplinary Optics Materials Science Optics Article FILMS OXIDE EXCITATION NETWORKS EDGE Transparent conductive coatings Surface plasmons Ellipsometry and polarimetry Antireflection coatings