Lee, Jihye Kim, Seon Hee Lee, Yeonhee 2024-01-20T09:00:21Z 2024-01-20T09:00:21Z 2021-09-02 2014-10 0142-2421 https://pubs.kist.re.kr/handle/201004/126305 Polycrystalline copper-indium-gallium-diselenide (CIGS) is used as an absorber in thin-film solar cells because of its appropriate band gap and high absorption coefficient for solar radiation. Many research groups have determined the CIGS compositions related to solar cell efficiency. In this work, three different Cu(In, Ga) Se-2 thin films were prepared on molybdenum back contacts deposited on soda-lime glass substrates via a three-stage evaporation or, alternatively, a two-step selenized process. Surface analyses via AES, XPS, and SIMS were used to characterize the CIGS thin films and compare their depth profiles. The MCs+ clusters were detected to improve the quantification of major compositions in the CIGS thin films while suppressing the matrix effect in the SIMS depth profiles. The compositional distribution in the MCs+-SIMS was in good agreement with the AES and XPS depth profiles. The MCs+-SIMS results proved more quantitatively accurate than those from the elemental SIMS while comparing to ICP-AES data. Copyright (C) 2014 John Wiley & Sons, Ltd. English John Wiley & Sons Inc. Quantitative analyses of photovoltaic CIGS thin films via SIMS depth profiling with elemental ions and MCs+ clusters Article 10.1002/sia.5432 1 Surface and Interface Analysis, v.46, no.10-11, pp.1099 - 1104 Surface and Interface Analysis 46 10-11 1099 1104 N scie scopus 000344987400093 2-s2.0-84908210945 Chemistry, Physical Chemistry Article; Proceedings Paper SOLAR-CELL DEVICES MOLECULAR-IONS ICP-OES AES EFFICIENCY ROUGHNESS SURFACE MASS-SPECTROMETRY SIMS depth profiling MCs+ clusters CIGS quantitative analysis