Hwang, Do Kyung Fuentes-Hernandez, Canek Fenoll, Mathieu Yun, Minseong Park, Jihoon Shim, Jae Won Knauer, Keith A. Dindar, Arnir Kim, Hyunichul Kim, Yongjin Kim, Jungbae Cheun, Hyeunseok Payne, Marcia M. Graham, Samuel Im, Seongil Anthony, John E. Kippelen, Bernard 2024-01-20T10:04:10Z 2024-01-20T10:04:10Z 2021-09-04 2014-03 1944-8244 https://pubs.kist.re.kr/handle/201004/127000 We report on a systematic investigation on the performance and stability of p-channel and n-channel top-gate OFETs, with a CYTOP/Al2O3 bilayer gate dielectric, exposed to controlled dry oxygen and humid atmospheres. Despite the severe conditions of environmental exposure, p-channel and n-channel top-gate OFETs show only minor changes of their performance parameters without undergoing irreversible damage. When correlated with the conditions of environmental exposure, these changes provide new insight into the possible physical mechanisms in the presence of oxygen and water. Photoexcited charge collection spectroscopy experiments provided further evidence of oxygen and water effects on OFETs. Top-gate OFETs also display outstanding durability, even when exposed to oxygen plasma and subsequent immersion in water or operated under aqueous media. These remarkable properties arise as a consequence of the use of relatively air stable organic semiconductors and proper engineering of the OFET structure. English American Chemical Society Systematic Reliability Study of Top-Gate p- and n-Channel Organic Field-Effect Transistors Article 10.1021/am405424k 1 ACS Applied Materials & Interfaces, v.6, no.5, pp.3378 - 3386 ACS Applied Materials & Interfaces 6 5 3378 3386 N scie scopus 000332922900043 2-s2.0-84896351939 Nanoscience & Nanotechnology Materials Science, Multidisciplinary Science & Technology - Other Topics Materials Science Article SEMICONDUCTOR PENTACENE STABILITY THIN-FILM TRANSISTORS HIGH-MOBILITY CHARGE-TRANSPORT ELECTRONICS CIRCUITS AIR POLYMER organic field-effect transistors soluble organic semiconductor CYTOP/Al2O3 bilayer dielectric device reliability photoexcited charge collection spectroscopy organic electronics