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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Si&#x20;Hieu&#x20;Nguyen</dcvalue>
<dcvalue element="contributor" qualifier="author">Lim,&#x20;Jong-Choo</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee,&#x20;Joong-Kee</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-20T10:30:30Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-20T10:30:30Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-04</dcvalue>
<dcvalue element="date" qualifier="issued">2014-03</dcvalue>
<dcvalue element="identifier" qualifier="issn">0021-891X</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;127061</dcvalue>
<dcvalue element="description" qualifier="abstract">The&#x20;influence&#x20;of&#x20;a&#x20;200&#x20;nm&#x20;Cu2O&#x20;coating&#x20;layer&#x20;on&#x20;the&#x20;electrochemical&#x20;performance&#x20;of&#x20;an&#x20;800&#x20;nm&#x20;Si&#x20;thin-film&#x20;anode&#x20;was&#x20;investigated&#x20;by&#x20;cyclic&#x20;voltammetry,&#x20;electrochemical&#x20;impedance&#x20;spectroscopy,&#x20;and&#x20;galvanostatic&#x20;charge&#x2F;discharge&#x20;measurements.&#x20;The&#x20;electrochemical&#x20;performance&#x20;of&#x20;the&#x20;Si&#x20;thin-film&#x20;anode&#x20;was&#x20;improved&#x20;by&#x20;the&#x20;coating&#x20;layer.&#x20;The&#x20;coated&#x20;Si&#x20;anode&#x20;exhibited&#x20;higher&#x20;values&#x20;of&#x20;conductivity&#x20;in&#x20;comparison&#x20;with&#x20;the&#x20;pristine&#x20;Si&#x20;anode.&#x20;Scanning&#x20;electron&#x20;microscopy&#x20;images&#x20;of&#x20;the&#x20;anodes&#x20;after&#x20;cycling&#x20;test&#x20;showed&#x20;that&#x20;the&#x20;coated&#x20;Si&#x20;anode&#x20;after&#x20;cycling&#x20;test&#x20;had&#x20;less&#x20;cracks&#x20;than&#x20;the&#x20;pristine&#x20;Si&#x20;anode.&#x20;The&#x20;galvanostatic&#x20;charge&#x2F;discharge&#x20;measurements&#x20;reveal&#x20;that&#x20;the&#x20;cyclability&#x20;and&#x20;rate&#x20;capability&#x20;of&#x20;the&#x20;coated&#x20;Si&#x20;thin-film&#x20;anode&#x20;were&#x20;better&#x20;than&#x20;the&#x20;pristine&#x20;Si&#x20;thin-film&#x20;anode.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">SPRINGER</dcvalue>
<dcvalue element="subject" qualifier="none">SOLID-ELECTROLYTE&#x20;INTERPHASE</dcvalue>
<dcvalue element="subject" qualifier="none">ELECTROCHEMICAL&#x20;PERFORMANCE</dcvalue>
<dcvalue element="subject" qualifier="none">NEGATIVE&#x20;ELECTRODES</dcvalue>
<dcvalue element="subject" qualifier="none">SURFACE-CHEMISTRY</dcvalue>
<dcvalue element="subject" qualifier="none">AUGER-SPECTRA</dcvalue>
<dcvalue element="subject" qualifier="none">THIN-FILMS</dcvalue>
<dcvalue element="subject" qualifier="none">CUO</dcvalue>
<dcvalue element="subject" qualifier="none">STABILITY</dcvalue>
<dcvalue element="subject" qualifier="none">PHOTOELECTRON</dcvalue>
<dcvalue element="subject" qualifier="none">TEMPERATURES</dcvalue>
<dcvalue element="title" qualifier="none">Improving&#x20;the&#x20;performance&#x20;of&#x20;silicon&#x20;anode&#x20;in&#x20;lithium-ion&#x20;batteries&#x20;by&#x20;Cu2O&#x20;coating&#x20;layer</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1007&#x2F;s10800-013-0648-9</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">JOURNAL&#x20;OF&#x20;APPLIED&#x20;ELECTROCHEMISTRY,&#x20;v.44,&#x20;no.3,&#x20;pp.353&#x20;-&#x20;360</dcvalue>
<dcvalue element="citation" qualifier="title">JOURNAL&#x20;OF&#x20;APPLIED&#x20;ELECTROCHEMISTRY</dcvalue>
<dcvalue element="citation" qualifier="volume">44</dcvalue>
<dcvalue element="citation" qualifier="number">3</dcvalue>
<dcvalue element="citation" qualifier="startPage">353</dcvalue>
<dcvalue element="citation" qualifier="endPage">360</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000331080400002</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-84897670390</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Electrochemistry</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Electrochemistry</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SOLID-ELECTROLYTE&#x20;INTERPHASE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ELECTROCHEMICAL&#x20;PERFORMANCE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">NEGATIVE&#x20;ELECTRODES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SURFACE-CHEMISTRY</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">AUGER-SPECTRA</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">THIN-FILMS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">CUO</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">STABILITY</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">PHOTOELECTRON</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">TEMPERATURES</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Lithium-ion&#x20;batteries</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Silicon&#x20;anode</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Cu2O&#x20;coating</dcvalue>
</dublin_core>
