Bae, Kiho Jang, Dong Young Choi, Sung Min Kim, Byung-Kook Lee, Jong-Ho Son, Ji-Won Shim, Joon Hyung 2024-01-20T10:31:30Z 2024-01-20T10:31:30Z 2021-09-05 2014-02-03 0040-6090 https://pubs.kist.re.kr/handle/201004/127109 Yttrium-doped barium zirconate (Y:BaZrO3, BZY) thin films were prepared using pulsed laser deposition (PLD) on MgO substrates at 700 degrees C by varying the ambient oxygen pressure. The microstructure and electrical properties were then investigated using transmission electron microscopy and electrochemical impedance spectroscopy. Dense, well-crystallized BZY films were produced at ambient oxygen pressures (P-amb,P-o2) of <= 6.67 Pa. At P-amb,P- (2)(o) = 13.3 Pa, conical amorphous defects and porous microstructures were observed in the films. The conductivity of PLD BZY prepared at P-amb,P-o2 <= 13.3 Pa was measured to be close to that of reference polycrystalline BZY films, and the grain-boundary properties governed the overall ion conduction, with nano-grains being covered by the space charge depletion zones. At P-amb,P-o2 >= 13.3 Pa, microstructural defects significantly degraded the electrical properties. (C) 2013 Elsevier B.V. All rights reserved. English ELSEVIER SCIENCE SA DOPED BARIUM ZIRCONATE OXIDE FUEL-CELLS PROTON CONDUCTION GRAIN-BOUNDARIES THIN-FILMS ELECTRICAL-CONDUCTIVITY ELECTROLYTE IMPEDANCE MICROSTRUCTURES CERAMICS Influence of background oxygen pressure on film properties of pulsed laser deposited Y:BaZrO3 Article 10.1016/j.tsf.2013.12.006 1 THIN SOLID FILMS, v.552, pp.24 - 31 THIN SOLID FILMS 552 24 31 scie scopus 000329987300004 2-s2.0-84892825573 Materials Science, Multidisciplinary Materials Science, Coatings & Films Physics, Applied Physics, Condensed Matter Materials Science Physics Article DOPED BARIUM ZIRCONATE OXIDE FUEL-CELLS PROTON CONDUCTION GRAIN-BOUNDARIES THIN-FILMS ELECTRICAL-CONDUCTIVITY ELECTROLYTE IMPEDANCE MICROSTRUCTURES CERAMICS Proton-conducting ceramics Solid oxide fuel cells Pulse-laser deposition Yttrium-doped barium zirconate Oxygen pressure Transmission electron microscopy Electrochemical impedance spectroscopy Grain-boundary depletion