이연희 이지혜 2024-01-20T11:30:37Z 2024-01-20T11:30:37Z 2022-01-10 2013-10 1225-0260 https://pubs.kist.re.kr/handle/201004/127559 Korean 비행시간형 이차이온질량분석(TOF-SIMS) 장비를 이용한 고분자 표면분석 및 최근동향 Characterization of Polymer Surface by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Article 2 Polymer Science and Technology, v.24, no.5, pp.528 - 534 Polymer Science and Technology 24 5 528 534 N other