Seo, Jong-Hyun Yoon, Sang-Won Kim, Kyou-Hyun Chang, Hye-Jung Lee, Kon-Bae Seong, Tae-Yeon Fleury, Eric Ahn, Jae-Pyoung 2024-01-20T12:00:17Z 2024-01-20T12:00:17Z 2022-01-25 2013-08 1431-9276 https://pubs.kist.re.kr/handle/201004/127786 We investigated the microstructural evolution of Sn96.4Ag2.8Cu0.8 solder through in situ heating transmission electron microscopy observations. As-soldered bump consisted of seven layers, containing the nanoeutectic lamella structure of AuSn and Au5Sn phases, and the polygonal grains of AuSn2 and AuSn4, on Au-plated Cu bond pads. Here, we found that there are two nanoeutectic lamellar layers with lamella spacing of 40 and 250 nm. By in situ heating above 140 degrees C, the nanoeutectic lamella of AuSn and Au5Sn was decomposed with structural degradation by sphering and coarsening processes of the lamellar interface. At the third layer neighboring to the lamella layer, on the other hand, Au5Sn particles with a zig-zag shape in AuSn matrix became spherical and were finally dissipated in order to minimize the interface energy between two phases. In the other layers except both lamella layers, polycrystal grains of AuSn2 and AuSn4 grew by normal grain growth during in situ heating. The high interface energy of nanoeutectic lamella and polygonal nanograins, which are formed by rapid solidification, acted as a principal driving force on the microstructural change during the in situ heating. English CAMBRIDGE UNIV PRESS In Situ Heating Transmission Electron Microscopy Observation of Nanoeutectic Lamellar Structure in Sn-Ag-Cu Alloy on Au Under-Bump Metallization Article 10.1017/S1431927613012312 1 MICROSCOPY AND MICROANALYSIS, v.19, pp.49 - 53 MICROSCOPY AND MICROANALYSIS 19 49 53 N scie scopus 000332111100012 2-s2.0-84881464620 Materials Science, Multidisciplinary Microscopy Materials Science Microscopy Article in situ heating Sn-Ag-Cu solder UBM microstructure TEM STEM