<?xml version="1.0" encoding="utf-8" standalone="no"?>
<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Yim,&#x20;Ju-Hyuk</dcvalue>
<dcvalue element="contributor" qualifier="author">Baek,&#x20;Seung-Hyub</dcvalue>
<dcvalue element="contributor" qualifier="author">Shin,&#x20;Hyun-Yong</dcvalue>
<dcvalue element="contributor" qualifier="author">Hyun,&#x20;Dow&#x20;Bin</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Jin-Sang</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-20T12:03:09Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-20T12:03:09Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-04</dcvalue>
<dcvalue element="date" qualifier="issued">2013-07</dcvalue>
<dcvalue element="identifier" qualifier="issn">0361-5235</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;127931</dcvalue>
<dcvalue element="description" qualifier="abstract">We&#x20;present&#x20;the&#x20;effects&#x20;of&#x20;In4Se3&#x20;addition&#x20;on&#x20;thermoelectric&#x20;properties&#x20;of&#x20;n-type&#x20;Bi2Te2.7Se0.3.&#x20;In&#x20;this&#x20;study,&#x20;polycrystalline&#x20;(In4Se3)&#x20;(x)&#x20;-(Bi2Te2.7Se0.3)(1-x)&#x20;pellets&#x20;were&#x20;prepared&#x20;by&#x20;mechanical&#x20;alloying&#x20;followed&#x20;by&#x20;spark&#x20;plasma&#x20;sintering&#x20;(SPS).&#x20;The&#x20;thermoelectric&#x20;properties&#x20;such&#x20;as&#x20;Seebeck&#x20;coefficient&#x20;and&#x20;electrical&#x20;and&#x20;thermal&#x20;conductivities&#x20;were&#x20;measured&#x20;in&#x20;the&#x20;temperature&#x20;range&#x20;of&#x20;300&#x20;K&#x20;to&#x20;500&#x20;K.&#x20;Addition&#x20;of&#x20;In4Se3&#x20;into&#x20;Bi2Te2.7Se0.3&#x20;resulted&#x20;in&#x20;segregation&#x20;of&#x20;In4Se3&#x20;phase&#x20;within&#x20;Bi2Te2.7Se0.3&#x20;matrix.&#x20;The&#x20;Seebeck&#x20;coefficient&#x20;of&#x20;the&#x20;(In4Se3)&#x20;(x)&#x20;-(Bi2Te2.7Se0.3)(1-x)&#x20;samples&#x20;exhibited&#x20;lower&#x20;values&#x20;compared&#x20;with&#x20;that&#x20;of&#x20;pure&#x20;Bi2Te2.7Se0.3&#x20;phase.&#x20;This&#x20;reduction&#x20;of&#x20;Seebeck&#x20;coefficient&#x20;in&#x20;n-type&#x20;(In4Se3)&#x20;(x)&#x20;-(Bi2Te2.7Se0.3)(1-x)&#x20;is&#x20;attributed&#x20;to&#x20;the&#x20;formation&#x20;of&#x20;unwanted&#x20;p-type&#x20;phases&#x20;by&#x20;interdiffusion&#x20;through&#x20;the&#x20;interface&#x20;between&#x20;(In4Se3)&#x20;(x)&#x20;and&#x20;(Bi2Te2.7Se0.3)(1-x)&#x20;as&#x20;well&#x20;as&#x20;consequently&#x20;formed&#x20;Te-deficient&#x20;matrix.&#x20;However,&#x20;the&#x20;decrease&#x20;in&#x20;electrical&#x20;resistivity&#x20;and&#x20;thermal&#x20;conductivity&#x20;with&#x20;addition&#x20;of&#x20;In4Se3&#x20;leads&#x20;to&#x20;an&#x20;enhanced&#x20;thermoelectric&#x20;figure&#x20;of&#x20;merit&#x20;(ZT)&#x20;at&#x20;a&#x20;temperature&#x20;range&#x20;over&#x20;450&#x20;K:&#x20;a&#x20;maximum&#x20;ZT&#x20;of&#x20;1.0&#x20;is&#x20;achieved&#x20;for&#x20;the&#x20;n-type&#x20;(In4Se3)(0.03)-(Bi2Te2.7Se0.3)(0.97)&#x20;sample&#x20;at&#x20;500&#x20;K.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">SPRINGER</dcvalue>
<dcvalue element="subject" qualifier="none">FILMS</dcvalue>
<dcvalue element="title" qualifier="none">Composition-Dependent&#x20;Thermoelectric&#x20;Properties&#x20;of&#x20;n-Type&#x20;Bi2Te2.7Se0.3&#x20;Doped&#x20;with&#x20;In4Se3</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1007&#x2F;s11664-013-2565-4</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">JOURNAL&#x20;OF&#x20;ELECTRONIC&#x20;MATERIALS,&#x20;v.42,&#x20;no.7,&#x20;pp.2178&#x20;-&#x20;2183</dcvalue>
<dcvalue element="citation" qualifier="title">JOURNAL&#x20;OF&#x20;ELECTRONIC&#x20;MATERIALS</dcvalue>
<dcvalue element="citation" qualifier="volume">42</dcvalue>
<dcvalue element="citation" qualifier="number">7</dcvalue>
<dcvalue element="citation" qualifier="startPage">2178</dcvalue>
<dcvalue element="citation" qualifier="endPage">2183</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000320890800141</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-84879797705</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Engineering,&#x20;Electrical&#x20;&amp;&#x20;Electronic</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Materials&#x20;Science,&#x20;Multidisciplinary</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Engineering</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Materials&#x20;Science</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">FILMS</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Bi2Te3</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">thermoelectric</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">nanostructure</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">In4Se3</dcvalue>
</dublin_core>
