Lee, Jihye Kang, Min Hwa Lee, Kang-Bong Lee, Yeonhee 2024-01-20T12:31:28Z 2024-01-20T12:31:28Z 2021-09-05 2013-05 1996-1944 https://pubs.kist.re.kr/handle/201004/128100 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS) are well established surface techniques that provide both elemental and organic information from several monolayers of a sample surface, while also allowing depth profiling or image mapping to be carried out. The static TOF-SIMS with improved performances has expanded the application of TOF-SIMS to the study of a variety of organic, polymeric and biological materials. In this work, TOF-SIMS, XPS and Fourier Transform Infrared (FTIR) measurements were used to characterize commercial natural dyes and traditional silk fabric dyed with plant extracts dyes avoiding the time-consuming and destructive extraction procedures necessary for the spectrophotometric and chromatographic methods previously used. Silk textiles dyed with plant extracts were then analyzed for chemical and functional group identification of their dye components and mordants. TOF-SIMS spectra for the dyed silk fabric showed element ions from metallic mordants, specific fragment ions and molecular ions from plant-extracted dyes. The results of TOF-SIMS, XPS and FTIR are very useful as a reference database for comparison with data about traditional Korean silk fabric and to provide an understanding of traditional dyeing materials. Therefore, this study shows that surface techniques are useful for micro-destructive analysis of plant-extracted dyes and Korean dyed silk fabric. English MDPI AG MASS-SPECTROMETRY ANCIENT TEXTILES MILD EXTRACTION DYESTUFFS SIMS Characterization of Natural Dyes and Traditional Korean Silk Fabric by Surface Analytical Techniques Article 10.3390/ma6052007 1 MATERIALS, v.6, no.5, pp.2007 - 2025 MATERIALS 6 5 2007 2025 scie scopus 000319440600029 2-s2.0-84881306040 Chemistry, Physical Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering Physics, Applied Physics, Condensed Matter Chemistry Materials Science Metallurgy & Metallurgical Engineering Physics Article MASS-SPECTROMETRY ANCIENT TEXTILES MILD EXTRACTION DYESTUFFS SIMS natural dyes traditional silk fabric mordants TOF-SIMS XPS FTIR surface techniques