Park, Chan-Rok Choi, Sun-Young You, Yil-Hwan Yang, Min Kyu Bae, Seung-Muk Lee, Jeon-Kook Hwang, Jin-Ha 2024-01-20T12:33:37Z 2024-01-20T12:33:37Z 2021-09-04 2013-04 0002-7820 https://pubs.kist.re.kr/handle/201004/128208 Impedance spectroscopy was applied to MnOx-based thin films prepared in symmetric and asymmetric electrode configurations, i.e., Pt/MnOx/Pt and Ta/MnOx/Pt, respectively. Equivalent circuit analysis suggests the presence of higher resistance surface layers adjacent the electrodes, in addition to a higher conductivity component at central portions of the MnOx thin films. The asymmetric configuration enables the Ta/MnOx interfacial layer to facilitate the redox transport of oxygen ions, where significant changes in resistance with the electric field are responsible for the higher on/off resistance ratio in Ta/MnOx/Pt. The higher dielectric constant and bias-dependent capacitance and resistance support the coexistence of both oxidized surfaces and interfacial layers. English WILEY RESISTANCE Impedance Spectroscopy Characterization in Bipolar Ta/MnOx/Pt Resistive Switching Thin Films Article 10.1111/jace.12185 1 JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.96, no.4, pp.1234 - 1239 JOURNAL OF THE AMERICAN CERAMIC SOCIETY 96 4 1234 1239 scie scopus 000317407600040 2-s2.0-84876130928 Materials Science, Ceramics Materials Science Article RESISTANCE Impedance Spectroscopy bipolar resistive switching Ta electrode MnOx