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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Rha,&#x20;Sang&#x20;Ho</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Un&#x20;Ki</dcvalue>
<dcvalue element="contributor" qualifier="author">Jung,&#x20;Jisim</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Hyo&#x20;Kyeom</dcvalue>
<dcvalue element="contributor" qualifier="author">Jung,&#x20;Yoon&#x20;Soo</dcvalue>
<dcvalue element="contributor" qualifier="author">Hwang,&#x20;Eun&#x20;Suk</dcvalue>
<dcvalue element="contributor" qualifier="author">Chung,&#x20;Yoon&#x20;Jang</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee,&#x20;Mijung</dcvalue>
<dcvalue element="contributor" qualifier="author">Choi,&#x20;Jung-Hae</dcvalue>
<dcvalue element="contributor" qualifier="author">Hwang,&#x20;Cheol&#x20;Seong</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-20T13:00:21Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-20T13:00:21Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-01</dcvalue>
<dcvalue element="date" qualifier="issued">2013-03</dcvalue>
<dcvalue element="identifier" qualifier="issn">0018-9383</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;128287</dcvalue>
<dcvalue element="description" qualifier="abstract">Asymmetric&#x20;Schottky&#x20;contact&#x20;thin-film-transistors&#x20;(ASC-TFTs)&#x20;with&#x20;an&#x20;amorphous-In2Ga2ZnO7&#x20;channel&#x20;were&#x20;fabricated,&#x20;and&#x20;their&#x20;operation&#x20;characteristics&#x20;were&#x20;examined.&#x20;Ti,&#x20;Ni,&#x20;and&#x20;Pt&#x20;were&#x20;evaluated&#x20;as&#x20;source&#x2F;drain&#x20;metal,&#x20;and&#x20;the&#x20;variations&#x20;in&#x20;the&#x20;device&#x20;performance&#x20;were&#x20;analyzed&#x20;in&#x20;terms&#x20;of&#x20;energy&#x20;level&#x20;and&#x20;bias&#x20;polarity,&#x20;which&#x20;were&#x20;carefully&#x20;simulated&#x20;to&#x20;understand&#x20;the&#x20;influence&#x20;of&#x20;the&#x20;contact&#x20;properties&#x20;on&#x20;the&#x20;device&#x20;performance.&#x20;The&#x20;contact&#x20;nature&#x20;largely&#x20;influenced&#x20;the&#x20;distribution&#x20;of&#x20;potential&#x20;under&#x20;the&#x20;given&#x20;gate&#x20;and&#x20;drain&#x20;biases,&#x20;as&#x20;well&#x20;as&#x20;the&#x20;accompanying&#x20;carrier&#x20;accumulation&#x20;layer&#x20;and&#x20;current&#x20;path&#x20;formation.&#x20;Schottky-type&#x20;contact&#x20;induced&#x20;conduction&#x20;path&#x20;formation&#x20;even&#x20;on&#x20;the&#x20;back&#x20;surface&#x20;of&#x20;the&#x20;channel&#x20;when&#x20;drain&#x20;voltage&#x20;was&#x20;high&#x20;even&#x20;with&#x20;sufficiently&#x20;high&#x20;gate&#x20;bias&#x20;being&#x20;applied.&#x20;Based&#x20;on&#x20;these&#x20;results,&#x20;by&#x20;applying&#x20;different&#x20;metal&#x20;for&#x20;each&#x20;source&#x20;and&#x20;drain&#x20;metal,&#x20;ASC-TFTs&#x20;integrating&#x20;TFTs&#x20;and&#x20;Schottky&#x20;diodes&#x20;were&#x20;fabricated,&#x20;which&#x20;showed&#x20;a&#x20;rectification&#x20;ratio&#x20;of&#x20;drain&#x20;current&#x20;higher&#x20;than&#x20;10(8)&#x20;according&#x20;to&#x20;the&#x20;bias&#x20;direction.&#x20;In&#x20;addition,&#x20;the&#x20;transfer&#x20;and&#x20;output&#x20;characteristics&#x20;of&#x20;ASC-TFTs&#x20;were&#x20;evaluated&#x20;for&#x20;various&#x20;operation&#x20;regimes,&#x20;and&#x20;the&#x20;roles&#x20;of&#x20;the&#x20;Schottky&#x20;junction&#x20;in&#x20;device&#x20;operation&#x20;were&#x20;studied&#x20;in&#x20;detail.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">IEEE-INST&#x20;ELECTRICAL&#x20;ELECTRONICS&#x20;ENGINEERS&#x20;INC</dcvalue>
<dcvalue element="subject" qualifier="none">SERIES-RESISTANCE</dcvalue>
<dcvalue element="subject" qualifier="none">OXIDE</dcvalue>
<dcvalue element="subject" qualifier="none">ELECTRODES</dcvalue>
<dcvalue element="subject" qualifier="none">INTERFACE</dcvalue>
<dcvalue element="title" qualifier="none">The&#x20;Electrical&#x20;Properties&#x20;of&#x20;Asymmetric&#x20;Schottky&#x20;Contact&#x20;Thin-Film&#x20;Transistors&#x20;with&#x20;Amorphous-In2Ga2ZnO7</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1109&#x2F;TED.2012.2236558</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">IEEE&#x20;TRANSACTIONS&#x20;ON&#x20;ELECTRON&#x20;DEVICES,&#x20;v.60,&#x20;no.3,&#x20;pp.1128&#x20;-&#x20;1135</dcvalue>
<dcvalue element="citation" qualifier="title">IEEE&#x20;TRANSACTIONS&#x20;ON&#x20;ELECTRON&#x20;DEVICES</dcvalue>
<dcvalue element="citation" qualifier="volume">60</dcvalue>
<dcvalue element="citation" qualifier="number">3</dcvalue>
<dcvalue element="citation" qualifier="startPage">1128</dcvalue>
<dcvalue element="citation" qualifier="endPage">1135</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000316820000033</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-84874662315</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Engineering,&#x20;Electrical&#x20;&amp;&#x20;Electronic</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Engineering</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SERIES-RESISTANCE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">OXIDE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ELECTRODES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">INTERFACE</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Amorphous&#x20;indium-gallium-zinc&#x20;oxide&#x20;(a-IGZO)</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Schottky&#x20;contact</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">thin-film&#x20;transistors&#x20;(TFTs)</dcvalue>
</dublin_core>
