Kim, Byoung-Joon Cho, Yigil Jung, Min-Suk Shin, Hae-A-Seul Moon, Myoung-Woon Han, Heung Nam Nam, Ki Tae Joo, Young-Chang Choi, In-Suk 2024-01-20T13:32:56Z 2024-01-20T13:32:56Z 2021-09-05 2012-11-05 1613-6810 https://pubs.kist.re.kr/handle/201004/128660 Design and fabrication of reliable electrodes is one of the most important challenges in flexible devices, which undergo repeated deformation. In conventional approaches, mechanical and electrical properties of continuous metal films degrade gradually because of the fatigue damage. The designed incorporation of nanoholes into Cu electrodes can enhance the reliability. In this study, the electrode shows extremely low electrical resistance change during bending fatigue because the nanoholes suppress crack initiation by preventing protrusion formation and damage propagation by crack tip blunting. This concept provides a key guideline for developing fatigue-free flexible electrodes. English WILEY-V C H VERLAG GMBH FILMS DEFORMATION MICROMECHANICS TRANSPARENT NANOWIRES PAPER Fatigue-Free, Electrically Reliable Copper Electrode with Nanohole Array Article 10.1002/smll.201200674 1 SMALL, v.8, no.21, pp.3300 - 3306 SMALL 8 21 3300 3306 scie scopus 000310600600009 2-s2.0-84868368667 Chemistry, Multidisciplinary Chemistry, Physical Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Chemistry Science & Technology - Other Topics Materials Science Physics Article FILMS DEFORMATION MICROMECHANICS TRANSPARENT NANOWIRES PAPER bending conductivity copper electrodes nanostructures