Lee, Jung-Hyun Ro, Hyun Wook Huang, Rui Lemaillet, Paul Germer, Thomas A. Soles, Christopher L. Stafford, Christopher M. 2024-01-20T13:34:36Z 2024-01-20T13:34:36Z 2021-08-31 2012-11 1530-6984 https://pubs.kist.re.kr/handle/201004/128746 By combining surface wrinkling and nanopatterned polymer films, we create anisotropic, hierarchical surfaces whose larger length-scale (wrinkling wavelength) depends intimately on the geometry and orientation of the smaller length-scale (nanopattern). We systematically vary the pattern pitch, pattern height, and residual layer thickness to ascertain the dependence of the wrinkling wavelength on the nanopattern geometry. We apply a composite mechanics Model to gain a quantitative understanding of the relationship between. the geometric parameters and the anisotropy in wrinkling wavelength. Additionally, these results shed light on the effect of surface roughness, as represented by the nanopattern, on the metrology of thin films via Surface wrinkling. English AMER CHEMICAL SOC SCALE ROUGHNESS Anisotropic, Hierarchical Surface Patterns via Surface Wrinkling of Nanopatterned Polymer Films Article 10.1021/nl303512d 1 NANO LETTERS, v.12, no.11, pp.5995 - 5999 NANO LETTERS 12 11 5995 5999 scie scopus 000311244400095 Chemistry, Multidisciplinary Chemistry, Physical Nanoscience & Nanotechnology Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Chemistry Science & Technology - Other Topics Materials Science Physics Article SCALE ROUGHNESS Polymeric materials thin films patterning nanostructures hierarchical structures metrology