Singh, J.P. Sulania, I. Prakash, J. Gautam, S. Chae, K.H. Kanjilal, D. Asokan, K. 2024-01-20T15:04:24Z 2024-01-20T15:04:24Z 2021-08-31 2012-04 0976-3961 https://pubs.kist.re.kr/handle/201004/129420 Present work reports 200 MeV Ag15+ irradiation induced effects on the surface morphology, grain size and local electronic structure in MgO thin films deposited by e-beam evaporation under ultra High vacuum. The grain size was found to decrease from 37 nm (pristine film) to 23 nm for the sample irradiated with fluence of 1×1012 ions/cm2 and thereafter it increases upto fluence of 5×1012 ions/cm2. Similar changes with ion fluence were also observed for surface roughness. Shifting and disappearance of peaks in X-ray absorption spectra with irradiation shows the electronic structure modification after irradiation. The detailed analysis of observed results has been done on the basis of existing theories. ？ 2012 VBRI Press. English VBRI Press Study of surface morphology and grain size of irradiated MgO thin films Article 10.5185/amlett.2012.1307 1 Advanced Materials Letters, v.3, no.2, pp.112 - 117 Advanced Materials Letters 3 2 112 117 scopus 2-s2.0-84873054681 Article Atomic force microscopy MgO X-ray absorption spectroscopy