Thakur, P. Kumar, Amit Gautam, S. Chae, K. H. 2024-01-20T16:05:14Z 2024-01-20T16:05:14Z 2021-09-05 2011-09-30 0040-6090 https://pubs.kist.re.kr/handle/201004/129970 We report on the electronic charge transfer in cobalt doped fullerene thin films by means of near-edge x-ray-absorption fine structure (NEXAFS) spectroscopy measurement. Co-doped fullerene films were prepared by co-deposition technique and subjected to energetic ion irradiation (120 MeV Au) for possibly alignment or interconnect of randomly distributed metal particles. Polarization dependent NEXAFS spectra revealed the alignment of Co and C atoms along the irradiated ionic path. The structural changes in Co-doped as-deposited and ion irradiated fullerene films were investigated by means of Raman spectroscopy measurements. Downshift of pentagonal pinch mode A(g)(2) in Raman spectroscopy indicated the electronic charge transfer from Co atom to fullerene molecules, which is further confirmed by NEXAFS at C K-edge for Co-doped fullerene films. (C) 2011 Elsevier B.V. All rights reserved. English ELSEVIER SCIENCE SA TRANSITION-METAL OXIDES FINE-STRUCTURE CARBON NANOTUBES C-60 NANOPARTICLES PHOTOEMISSION ADSORPTION GRAPHITE CLUSTERS SPECTRA Electronic charge transfer in cobalt doped fullerene thin films and effect of energetic ion impacts by x-ray absorption spectroscopy Article 10.1016/j.tsf.2011.03.059 1 THIN SOLID FILMS, v.519, no.23, pp.8401 - 8405 THIN SOLID FILMS 519 23 8401 8405 scie scopus 000295663200051 2-s2.0-80052783743 Materials Science, Multidisciplinary Materials Science, Coatings & Films Physics, Applied Physics, Condensed Matter Materials Science Physics Article TRANSITION-METAL OXIDES FINE-STRUCTURE CARBON NANOTUBES C-60 NANOPARTICLES PHOTOEMISSION ADSORPTION GRAPHITE CLUSTERS SPECTRA Fullerene Composite films Ion beam Raman NEXAFS