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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Nam,&#x20;Seungwoong</dcvalue>
<dcvalue element="contributor" qualifier="author">Cho,&#x20;Hyun&#x20;Woo</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Taeho</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Daeheum</dcvalue>
<dcvalue element="contributor" qualifier="author">Sung,&#x20;Bong&#x20;June</dcvalue>
<dcvalue element="contributor" qualifier="author">Lim,&#x20;Soonho</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Heesuk</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-20T16:34:06Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-20T16:34:06Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-05</dcvalue>
<dcvalue element="date" qualifier="issued">2011-07-25</dcvalue>
<dcvalue element="identifier" qualifier="issn">0003-6951</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;130170</dcvalue>
<dcvalue element="description" qualifier="abstract">We&#x20;experimentally&#x20;and&#x20;theoretically&#x20;demonstrated&#x20;that&#x20;the&#x20;addition&#x20;of&#x20;silica&#x20;particles&#x20;could&#x20;improve&#x20;both&#x20;the&#x20;electrical&#x20;conductivity&#x20;and&#x20;the&#x20;thermomechanical&#x20;properties&#x20;of&#x20;epoxy&#x2F;silver&#x20;nanocomposites.&#x20;As&#x20;silica&#x20;particles&#x20;were&#x20;added,&#x20;the&#x20;electrical&#x20;percolation&#x20;threshold&#x20;concentration&#x20;of&#x20;silver&#x20;nanoparticles&#x20;decreased&#x20;and&#x20;the&#x20;electrical&#x20;resistivity&#x20;of&#x20;the&#x20;composite&#x20;decreased&#x20;by&#x20;about&#x20;8&#x20;orders&#x20;of&#x20;magnitude.&#x20;The&#x20;coefficient&#x20;of&#x20;thermal&#x20;expansion&#x20;also&#x20;decreased&#x20;with&#x20;increasing&#x20;volume&#x20;fraction&#x20;of&#x20;silica&#x20;particles.&#x20;Molecular&#x20;simulations&#x20;showed&#x20;that&#x20;the&#x20;additional&#x20;silica&#x20;particles&#x20;made&#x20;the&#x20;effective&#x20;intermolecular&#x20;interactions&#x20;between&#x20;silver&#x20;nanoparticles&#x20;attractive,&#x20;thereby&#x20;enhancing&#x20;the&#x20;formation&#x20;of&#x20;an&#x20;electrical&#x20;percolation&#x20;network.&#x20;(C)&#x20;2011&#x20;American&#x20;Institute&#x20;of&#x20;Physics.&#x20;[doi:10.1063&#x2F;1.3615690]</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">AMER&#x20;INST&#x20;PHYSICS</dcvalue>
<dcvalue element="subject" qualifier="none">CONDUCTIVE&#x20;ADHESIVES</dcvalue>
<dcvalue element="subject" qualifier="none">FAILURE&#x20;MECHANISMS</dcvalue>
<dcvalue element="subject" qualifier="none">FLIP-CHIP</dcvalue>
<dcvalue element="subject" qualifier="none">RELIABILITY</dcvalue>
<dcvalue element="subject" qualifier="none">COMPOSITES</dcvalue>
<dcvalue element="subject" qualifier="none">SIZE</dcvalue>
<dcvalue element="subject" qualifier="none">RESISTANCE</dcvalue>
<dcvalue element="subject" qualifier="none">SOLDER</dcvalue>
<dcvalue element="title" qualifier="none">Effects&#x20;of&#x20;silica&#x20;particles&#x20;on&#x20;the&#x20;electrical&#x20;percolation&#x20;threshold&#x20;and&#x20;thermomechanical&#x20;properties&#x20;of&#x20;epoxy&#x2F;silver&#x20;nanocomposites</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1063&#x2F;1.3615690</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">APPLIED&#x20;PHYSICS&#x20;LETTERS,&#x20;v.99,&#x20;no.4</dcvalue>
<dcvalue element="citation" qualifier="title">APPLIED&#x20;PHYSICS&#x20;LETTERS</dcvalue>
<dcvalue element="citation" qualifier="volume">99</dcvalue>
<dcvalue element="citation" qualifier="number">4</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000293475500059</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-79961080129</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">CONDUCTIVE&#x20;ADHESIVES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">FAILURE&#x20;MECHANISMS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">FLIP-CHIP</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">RELIABILITY</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">COMPOSITES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SIZE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">RESISTANCE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SOLDER</dcvalue>
</dublin_core>
