Noh, Jin-Seo Kim, Hyunsu Chun, Dong Won Jeong, Won Yong Lee, Wooyoung 2024-01-20T16:34:50Z 2024-01-20T16:34:50Z 2021-09-05 2011-07 1567-1739 https://pubs.kist.re.kr/handle/201004/130206 FePt patterned media were fabricated with varying pattern size, employing a deposition-last process and a CrV seed layer. The FePt patterns of sizes down to 30 nm showed a well-developed FCT structure characteristic of L1(0) phase. Due to the chemical and structural ordering, even 30 nm-sized FePt patterns exhibited a high ratio (3.4) of out-of-plane coercivity to in-plane coercivity and almost the same remanent magnetization as the saturation magnetization, indicating that a high perpendicular anisotropy is retained in the tiny patterns. The array of 30 nm patterns corresponds to a bit density of 1.8 Tbit/in(2), demonstrating that terabit-density magnetic storage can be fabricated using the deposition-last process. (C) 2011 Elsevier B.V. All rights reserved. English ELSEVIER MAGNETIC-PROPERTIES FILMS Hyperfine FePt patterned media for terabit data storage Article 10.1016/j.cap.2011.07.006 1 CURRENT APPLIED PHYSICS, v.11, no.4, pp.S33 - S35 CURRENT APPLIED PHYSICS 11 4 S33 S35 scie scopus kci 000296726300010 2-s2.0-80455155107 Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Article; Proceedings Paper MAGNETIC-PROPERTIES FILMS FePt patterned media CrV seed layer Deposition-last process Perpendicular anisotropy Magnetic storage