Lee, Jae-Chul Lee, Kang-Soo Cho, Cheong-Gu Moon, Kyoung-Woong Shin, Kyung-Ho Choe, Sug-Bong 2024-01-20T19:04:42Z 2024-01-20T19:04:42Z 2021-09-02 2010-06 0018-9464 https://pubs.kist.re.kr/handle/201004/131421 The domain patterns and magnetization reversal behaviors in oxide/Co/Pt films are examined with varying the thickness of Co layer from 0.7 nm to 2.0 nm. The films are grown on Al2O3, MgO and SiO2 layers. All the films exhibit strong perpendicular magnetic anisotropy, but the anisotropy decreases with increasing Co layer thickness for all the oxide layers. The decrement rate is different for different oxide layers. The domain patterns show the transition between the wall-motion and dendrite-growth dominant behaviors, and the critical thickness is estimated to be about 1.0 nm irrespective of the oxide layers. We summarize the magnetic properties of oxide/Co/Pt films with respect to the Co-thickness and various oxide layers. English IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC PERPENDICULAR ANISOTROPY DYNAMICS Domain Patterns and Magnetization Reversal Behaviors in Oxide/Co/Pt Films Article 10.1109/TMAG.2010.2040813 1 IEEE TRANSACTIONS ON MAGNETICS, v.46, no.6, pp.2009 - 2011 IEEE TRANSACTIONS ON MAGNETICS 46 6 2009 2011 scie scopus 000278037800190 2-s2.0-77952829288 Engineering, Electrical & Electronic Physics, Applied Engineering Physics Article PERPENDICULAR ANISOTROPY DYNAMICS Domain pattern oxide/Co interface perpendicular magnetic anisotropy