Kim, Sung Moon Son, Ji-Won Lee, Kyung-Ryul Kim, Hyoungchul Kim, Hae-Ryoung Lee, Hae-Weon Lee, Jong-Ho 2024-01-20T19:31:43Z 2024-01-20T19:31:43Z 2021-09-02 2010-05 1385-3449 https://pubs.kist.re.kr/handle/201004/131524 The physical and electrical properties of sputtered YSZ thin films on various substrates were investigated. The in-plane electrical properties of the films were measured for evaluating YSZ thin film for co-planar SOFC electrolytes. The conductance measured on YSZ over Si substrates was significantly affected by the buffer layer thickness and exhibited higher values than that of YSZ on sapphire. This indicates that electrical leakage occurred through the substrate when Si substrates were utilized. Nevertheless, pure ionic conduction was observed in YSZ/sapphire regardless of the film thickness. It implies that much care should be taken for the selection of substrate materials in measuring or utilizing in-plane conductivity, especially for high temperature applications. English SPRINGER OXIDE FUEL-CELLS ELECTROCHEMICAL CHARACTERIZATION CONDUCTIVITY ELECTRODES DEPOSITION SYSTEM Substrate effect on the electrical properties of sputtered YSZ thin films for co-planar SOFC applications Article 10.1007/s10832-008-9550-y 1 JOURNAL OF ELECTROCERAMICS, v.24, no.3, pp.153 - 160 JOURNAL OF ELECTROCERAMICS 24 3 153 160 scie scopus 000276721600003 2-s2.0-77956592046 Materials Science, Ceramics Materials Science Article OXIDE FUEL-CELLS ELECTROCHEMICAL CHARACTERIZATION CONDUCTIVITY ELECTRODES DEPOSITION SYSTEM YSZ thin film Sputtering Electrical conductivity Substrate effect Co-planar SOFC