Sun, Chang Woo Lee, Jeong Yong Kim, Yong Tae 2024-01-20T20:34:00Z 2024-01-20T20:34:00Z 2021-09-04 2009-10 1862-6254 https://pubs.kist.re.kr/handle/201004/132125 Since the rhombohedral unit cell in the NaCl lattice is caused by distortion along the < 111 > NaCl direction, the same phenomenon is expected during phase transition of Ge-Bi-Te (GBT). With this assumption, we performed transmission electron microscopy (TEM) studies on the phase transition in GBT alloys annealed at temperatures between the two crystallization temperatures. Atomic-scale TEM images show the formation of a GBT intermediate structure during the phase transition. Using the obtained results, we developed a new phase transition model in which the Ge/Bi layers are ordered in the < 111 > direction; further, continuous shearing and dilation occur in the {111} plane in < 111 > direction. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim English WILEY-V C H VERLAG GMBH PHASE-CHANGE MATERIALS SYSTEM NACL Mechanism of shear transformation in Ge-Bi-Te alloys Article 10.1002/pssr.200903214 1 PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.3, no.7-8, pp.254 - 256 PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS 3 7-8 254 256 scie scopus 000271552200016 2-s2.0-71149111874 Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Materials Science Physics Article PHASE-CHANGE MATERIALS SYSTEM NACL GeBiTe Phase change memory