<?xml version="1.0" encoding="utf-8" standalone="no"?>
<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">이득희</dcvalue>
<dcvalue element="contributor" qualifier="author">김상식</dcvalue>
<dcvalue element="contributor" qualifier="author">이상렬</dcvalue>
<dcvalue element="contributor" qualifier="author">임재현</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-20T20:35:10Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-20T20:35:10Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-06</dcvalue>
<dcvalue element="date" qualifier="issued">2009-09</dcvalue>
<dcvalue element="identifier" qualifier="issn">1226-7945</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;132182</dcvalue>
<dcvalue element="description" qualifier="abstract">We&#x20;described&#x20;the&#x20;growth&#x20;of&#x20;undoped&#x20;ZnO&#x20;thin&#x20;films&#x20;and&#x20;their&#x20;optical&#x20;properties&#x20;changing&#x20;with&#x20;a&#x20;various&#x20;growth&#x20;temperature.&#x20;The&#x20;undoped&#x20;ZnO&#x20;thin&#x20;films&#x20;were&#x20;grown&#x20;on&#x20;c-Al2O3&#x20;substrates&#x20;using&#x20;pulsed&#x20;laser&#x20;deposition&#x20;(PLD)&#x20;at&#x20;room&#x20;temperature,&#x20;200,&#x20;400,&#x20;and&#x20;600oC,&#x20;respectively.&#x20;Field&#x20;emission&#x20;microscopy&#x20;(FE-SEM)&#x20;measurements&#x20;showed&#x20;that&#x20;the&#x20;grain&#x20;size&#x20;of&#x20;undoped&#x20;ZnO&#x20;thin&#x20;films&#x20;are&#x20;increasing&#x20;as&#x20;a&#x20;increase&#x20;of&#x20;growth&#x20;temperature.&#x20;In&#x20;addition,&#x20;we&#x20;were&#x20;investigated&#x20;that&#x20;the&#x20;structural&#x20;and&#x20;optical&#x20;properties&#x20;of&#x20;undoped&#x20;ZnO&#x20;thin&#x20;films&#x20;by&#x20;x-ray&#x20;diffraction&#x20;(XRD)&#x20;and&#x20;photoluminescence&#x20;(PL)&#x20;studied.&#x20;Also,&#x20;we&#x20;could&#x20;confirmed&#x20;that&#x20;the&#x20;exciton&#x20;luminescence&#x20;was&#x20;strongly&#x20;related&#x20;to&#x20;charge&#x20;trap&#x20;by&#x20;grain&#x20;boundary&#x20;of&#x20;the&#x20;samples&#x20;using&#x20;micro-PL&#x20;measurement.</dcvalue>
<dcvalue element="language" qualifier="none">Korean</dcvalue>
<dcvalue element="publisher" qualifier="none">한국전기전자재료학회</dcvalue>
<dcvalue element="title" qualifier="none">펄스&#x20;레이져&#x20;증착법으로&#x20;성장한&#x20;ZnO&#x20;박막의&#x20;마이크로&#x20;PL&#x20;특성&#x20;분석</dcvalue>
<dcvalue element="title" qualifier="alternative">Investigation&#x20;on&#x20;the&#x20;Micro-photoluminescence&#x20;of&#x20;ZnO&#x20;Thin&#x20;Films&#x20;Grown&#x20;by&#x20;Pulsed&#x20;Laser&#x20;Deposition</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="description" qualifier="journalClass">2</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">전기전자재료학회논문지,&#x20;v.22,&#x20;no.9,&#x20;pp.756&#x20;-&#x20;759</dcvalue>
<dcvalue element="citation" qualifier="title">전기전자재료학회논문지</dcvalue>
<dcvalue element="citation" qualifier="volume">22</dcvalue>
<dcvalue element="citation" qualifier="number">9</dcvalue>
<dcvalue element="citation" qualifier="startPage">756</dcvalue>
<dcvalue element="citation" qualifier="endPage">759</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">kci</dcvalue>
<dcvalue element="identifier" qualifier="kciid">ART001372593</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">ZnO</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Oxide&#x20;semiconductor</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Thin&#x20;films</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Pulsed&#x20;laser&#x20;deposition</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Photoluminescence</dcvalue>
</dublin_core>
