<?xml version="1.0" encoding="utf-8" standalone="no"?>
<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Cho,&#x20;Kwang-Hwan</dcvalue>
<dcvalue element="contributor" qualifier="author">Kang,&#x20;Chong-Yun</dcvalue>
<dcvalue element="contributor" qualifier="author">Yoon,&#x20;Seok-Jin</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee,&#x20;YoungPak</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-20T22:32:16Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-20T22:32:16Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-08-31</dcvalue>
<dcvalue element="date" qualifier="issued">2008-11</dcvalue>
<dcvalue element="identifier" qualifier="issn">0374-4884</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;133037</dcvalue>
<dcvalue element="description" qualifier="abstract">ZrO2-doped&#x20;(Ba0.6Sr0.4)TiO3&#x20;(BST)&#x20;thin&#x20;films&#x20;with&#x20;different&#x20;ZrO2&#x20;contents&#x20;were&#x20;deposited&#x20;on&#x20;(100)&#x20;LaAlO3&#x20;substrates&#x20;by&#x20;reactive&#x20;magnetron&#x20;co-sputtering.&#x20;The&#x20;dielectric&#x20;properties&#x20;of&#x20;the&#x20;ZrO2-doped&#x20;BST&#x20;thin&#x20;films&#x20;were&#x20;measured&#x20;using&#x20;a&#x20;symmetrical&#x20;stripline&#x20;resonator&#x20;with&#x20;shorted&#x20;ends&#x20;ranging&#x20;from&#x20;1&#x20;to&#x20;3&#x20;GHz.&#x20;We&#x20;demonstrated&#x20;that&#x20;doping&#x20;with&#x20;ZrO2&#x20;significantly&#x20;improved&#x20;the&#x20;dielectric&#x20;properties&#x20;of&#x20;the&#x20;BST&#x20;thin&#x20;films.&#x20;ZrO2&#x20;doping&#x20;successfully&#x20;reduced&#x20;the&#x20;dielectric&#x20;loss&#x20;tangent&#x20;(tan&#x20;delta)&#x20;from&#x20;9.2&#x20;x&#x20;10(-3)&#x20;(pure&#x20;BST)&#x20;to&#x20;2.9&#x20;x&#x20;10(-3)&#x20;(ZrO2&#x20;doped&#x20;BST).&#x20;The&#x20;results&#x20;of&#x20;this&#x20;study&#x20;showed&#x20;that&#x20;the&#x20;BST&#x20;films&#x20;remained&#x20;tunable&#x20;in&#x20;a&#x20;range&#x20;of&#x20;29&#x20;similar&#x20;to&#x20;42.7&#x20;%,&#x20;which&#x20;is&#x20;sufficient&#x20;for&#x20;tunable&#x20;microwave&#x20;device&#x20;applications.&#x20;Consequently,&#x20;ZrO2&#x20;doping&#x20;improved&#x20;the&#x20;figure&#x20;of&#x20;merit&#x20;(K)&#x20;for&#x20;the&#x20;films&#x20;from&#x20;K&#x20;=&#x20;46.4&#x20;(pure&#x20;BST)&#x20;to&#x20;K&#x20;=&#x20;114.1&#x20;(ZrO2-doped&#x20;BST).</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">KOREAN&#x20;PHYSICAL&#x20;SOC</dcvalue>
<dcvalue element="subject" qualifier="none">TUNABLE&#x20;MICROWAVE&#x20;APPLICATIONS</dcvalue>
<dcvalue element="subject" qualifier="none">FERROELECTRIC&#x20;MATERIALS</dcvalue>
<dcvalue element="subject" qualifier="none">CERAMICS</dcvalue>
<dcvalue element="title" qualifier="none">Improved&#x20;Dielectric&#x20;Properties&#x20;of&#x20;ZrO2-Doped&#x20;Ba0.6Sr0.4TiO3&#x20;Thin&#x20;Films&#x20;Deposited&#x20;by&#x20;Reactive&#x20;Magnetron&#x20;Co-Sputtering</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.3938&#x2F;jkps.53.2378</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">JOURNAL&#x20;OF&#x20;THE&#x20;KOREAN&#x20;PHYSICAL&#x20;SOCIETY,&#x20;v.53,&#x20;no.5,&#x20;pp.2378&#x20;-&#x20;2381</dcvalue>
<dcvalue element="citation" qualifier="title">JOURNAL&#x20;OF&#x20;THE&#x20;KOREAN&#x20;PHYSICAL&#x20;SOCIETY</dcvalue>
<dcvalue element="citation" qualifier="volume">53</dcvalue>
<dcvalue element="citation" qualifier="number">5</dcvalue>
<dcvalue element="citation" qualifier="startPage">2378</dcvalue>
<dcvalue element="citation" qualifier="endPage">2381</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">kci</dcvalue>
<dcvalue element="identifier" qualifier="kciid">ART001468646</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000260935000004</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-57349125317</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Multidisciplinary</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">TUNABLE&#x20;MICROWAVE&#x20;APPLICATIONS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">FERROELECTRIC&#x20;MATERIALS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">CERAMICS</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Dielectric&#x20;loss</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Tunable&#x20;microwave&#x20;device</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Reactive&#x20;co-sputtering</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">Ferroelectric</dcvalue>
</dublin_core>
