Sun, Chang Woo Lee, Jeong Yong Kim, Yong Tae 2024-01-20T22:34:18Z 2024-01-20T22:34:18Z 2021-09-03 2008-10 0021-4922 https://pubs.kist.re.kr/handle/201004/133122 The crystallization tendency and phase transition behavior of Ge-Bi-Te chalcogenide, thin films were investigated with high-resolution transmission electron microscopy. The experimental results show that metastable NaCl changes occur in the stable rhombohedral structure through an intermediate structure with a monoclinic lattice and, secondly, that the motive force of such a phase transformation is the shearing distortion of the metastable structure along the < 100 > direction. English IOP PUBLISHING LTD TRANSMISSION ELECTRON-MICROSCOPY TETRADYMITE-LIKE COMPOUNDS INTERMETALLIC COMPOUND CRYSTAL-STRUCTURES X-RAY GE2SB2TE5 DIFFRACTION SYSTEM CRYSTALLIZATION Phase Transition Behavior of Ge-Bi-Te Thin Films from an NaCl to Rhombohedral Structure Article 10.1143/JJAP.47.7983 1 JAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.10, pp.7983 - 7985 JAPANESE JOURNAL OF APPLIED PHYSICS 47 10 7983 7985 scie scopus 000260443900050 2-s2.0-62249172137 Physics, Applied Physics Article TRANSMISSION ELECTRON-MICROSCOPY TETRADYMITE-LIKE COMPOUNDS INTERMETALLIC COMPOUND CRYSTAL-STRUCTURES X-RAY GE2SB2TE5 DIFFRACTION SYSTEM CRYSTALLIZATION Ge-Bi-Te transition mechanism phase change material transmission electron microscopy