Lee, Jungil Han, Ilki Yu, Byung-Yong Yi, Gyu-Chul Ghibaudo, Gerard 2024-01-20T23:03:07Z 2024-01-20T23:03:07Z 2021-09-03 2008-07 0374-4884 https://pubs.kist.re.kr/handle/201004/133363 In this paper, we propose a random walk model as the main generation. mechanism for low-frequency noise in ZnO nanorod structures where surface states are involved. In this model, electrons in the channel can be trapped at surface states and perform a random walk between different surface states before being detrapped into the channel, in this model. Analytic expressions for the spectral noise density and the Hooge parameter are derived and applied to analyze the experimental results on back-gate ZnO-nanorod field-effect transistors from the literature. An analysis using this model provided quantitative information on the surface states in different atmospheric conditions. According to the model, the Hooge parameter is a function of the temperature, carrier concentration, the size of the nanorod and the surface states density and in particular, is inversely proportional to the radius of the nanorod. This model can be utilized in the analysis of low-frequency noise in other types of nanorod devices. English KOREAN PHYSICAL SOC LOW-FREQUENCY NOISE ELECTRICAL CHARACTERISTICS NANOROD-ARRAYS RANDOM-WALK 1/F NOISE FABRICATION FLUCTUATIONS ELECTRONS Physical understanding of the Hooge parameter in ZnO nanowire devices Article 10.3938/jkps.53.339 1 JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, no.1, pp.339 - 342 JOURNAL OF THE KOREAN PHYSICAL SOCIETY 53 1 339 342 scie scopus kci ART001464084 000257664700073 2-s2.0-49649085589 Physics, Multidisciplinary Physics Article; Proceedings Paper LOW-FREQUENCY NOISE ELECTRICAL CHARACTERISTICS NANOROD-ARRAYS RANDOM-WALK 1/F NOISE FABRICATION FLUCTUATIONS ELECTRONS ZnO nanorod field-effect transistors low-frequency noise surface states