Jeong, Jung Hwa Kim, Kyoung Chan Il Lee, Jung Kim, Hyun Jae Han, Il Ki 2024-01-20T23:03:24Z 2024-01-20T23:03:24Z 2021-08-31 2008-07 1041-1135 https://pubs.kist.re.kr/handle/201004/133376 English IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC SUPERLUMINESCENT DIODES Junction temperature measurement of InAs quanturn-dot laser diodes by utilizing voltage-temperature method Article 10.1109/LPT.2008.926802 1 IEEE PHOTONICS TECHNOLOGY LETTERS, v.20, no.13-16, pp.1354 - 1356 IEEE PHOTONICS TECHNOLOGY LETTERS 20 13-16 1354 1356 scie scopus 000258505800090 2-s2.0-49349089391 Engineering, Electrical & Electronic Optics Physics, Applied Engineering Optics Physics Article SUPERLUMINESCENT DIODES forward voltage-temperature (V-T) method junction temperature quantum-dot (QD) laser diodes (LDs)