Kim, Eun Tae Lee, Jeong Yong Kim, Yong Tae 2024-01-21T00:05:52Z 2024-01-21T00:05:52Z 2021-09-02 2007-11 0021-4922 https://pubs.kist.re.kr/handle/201004/134016 The microstructural properties of SexTe100-x (x = 16, 29, 38) thin films are investigated by X-ray diffraction (XRD) and transmission electron microscopy (TEM) analysis. SexTe100-x, thin films have a Te hexagonal structure and Te{011} interplanar spacing decreases because some Se atoms occupy Te atomic sites, forming Se helical chains within the Te helical chains. By increasing the Se contents from 16 to 29 at. %, Se5.95Te1.05 monoclinic and Se hexagonal structures coexist in a grain and at 38 at. %, a Se hexagonal structure is observed within the Te hexagonal grain. This means that SexTe100-x thin films maintain the Te hexagonal structure and that phase separation does not occur owing to the short diffusion time. English JAPAN SOC APPLIED PHYSICS CONDUCTIVITY ALLOY SETE Microstructural investigation of SexTe100-x thin films deposited on Si(100) substrates by x-ray diffractometer and transmission electron Microscopy analysis Article 10.1143/JJAP.46.7392 1 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.46, no.11, pp.7392 - 7395 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 46 11 7392 7395 scie scopus 000251220000048 2-s2.0-35948972479 Physics, Applied Physics Article CONDUCTIVITY ALLOY SETE transmission electron microscopy Se-Te solid solution Se5.95Te1.05 monoclinic structure