Park, H. Choi, H. W. Choi, W. K. 2024-01-21T00:34:10Z 2024-01-21T00:34:10Z 2021-09-02 2007-08-05 0257-8972 https://pubs.kist.re.kr/handle/201004/134205 InP(100) crystal surfaces were irradiated by ion beams with low energy (180-225 eV) and high flux (similar to 10(15)/cm(2) s) and the self-organization process induced by the ion beam was investigated by examining natiostructures formed during the ion beam exposure. An electrostatic closed electron Hall drift thruster with a broad beam size was used as an ion source. While the incident angle (theta), ion flux (J), and ion fluence (phi) were changed and the InP crystal was rotated, cone-like, ripple, anisotropic natiostructures were observed on the surface by an atomic force microscope. The wavelength of the ripple was about 40 nm, which is smaller than values ever previously reported, and the dependence of ripple wavelength oil ion flux follows well the predictions of the Bradley-Harper model. As the incident angle was varied, the root mean square of the surface roughness slightly increased up to the critical angle and then suddenly decreased, presumably due to the decrease of sputtering yield. Continuous rotation of the sample led to the fort-nation of nano dots with the size of 95-260 nm. (C) 2007 Elsevier B.V. All tights reserved. English ELSEVIER SCIENCE SA INDUCED RIPPLE TOPOGRAPHY INP BOMBARDMENT ROUGHNESS SURFACES FLUENCE YIELD Nano patterning and structuring of InP(100) by low energy ion beam irradiation Article 10.1016/j.surfcoat.2006.10.057 1 SURFACE & COATINGS TECHNOLOGY, v.201, no.19-20, pp.8469 - 8476 SURFACE & COATINGS TECHNOLOGY 201 19-20 8469 8476 scie scopus 000249034000097 2-s2.0-34447521852 Materials Science, Coatings & Films Physics, Applied Materials Science Physics Article; Proceedings Paper INDUCED RIPPLE TOPOGRAPHY INP BOMBARDMENT ROUGHNESS SURFACES FLUENCE YIELD nano patterning low energy ion irradiation InP(100) nano dot ripple bradley-harper