Choi, Pyuck-Pa Kwon, Young-Soon Kim, Ji-Soon Al-Kassab, Tala&apos;at 2024-01-21T01:05:30Z 2024-01-21T01:05:30Z 2021-09-02 2007-04 0022-0744 https://pubs.kist.re.kr/handle/201004/134501 The preparation of transmission electron microscopy (TEM) and atom probe-field ion microscopy (AP-FIM) specimens from mechanically alloyed Ti-Cu-Ni-Sn powder has been explored. Applying the focused ion beam (FIB) based in situ lift-out technique, it has been demonstrated that specimen preparation can be carried on single micrometre-sized powder particles without the use of any embedding media. Since the particles did not incorporate any micropores, as revealed by cross-sectioning, the standard procedure known for bulk samples could be simply implemented to the powder material. A sequence of rectangular cuts and annular milling was found to be a highly efficient way of forming a tip-shaped AP-FIM specimen from a square cross-section blank. A Ga level <= 1 at.% was detected if a low beam current of 10 pA was chosen for the final ion-milling stages. Implanted Ga ions were mostly confined to a zone of about 2 nm in thickness and indicated that ion-induced structural transformations were negligible. English OXFORD UNIV PRESS BULK AMORPHOUS-ALLOYS FILM STRUCTURES TEM FIB EXTRUSION SEM Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique Article 10.1093/jmicro/dfm003 1 JOURNAL OF ELECTRON MICROSCOPY, v.56, no.2, pp.43 - 49 JOURNAL OF ELECTRON MICROSCOPY 56 2 43 49 scie scopus 000250624300002 2-s2.0-35348876623 Microscopy Microscopy Article BULK AMORPHOUS-ALLOYS FILM STRUCTURES TEM FIB EXTRUSION SEM transmission electron microscopy field ion microscopy atom probe focused ion beam in-situ lift-out powder materials