Chi-Anh, Nguyen Moon, Sung 2024-01-21T01:31:03Z 2024-01-21T01:31:03Z 2021-09-05 2007-03 1350-4495 https://pubs.kist.re.kr/handle/201004/134585 Vanadium tungsten oxide is a promising bolometric material for thermal sensing applications. Two samples with different vanadium tungsten oxide thickness were prepared for excess noise measurement. No sign of random telegraph signal noise was found. Results show low 1/f noise in the measurement frequency range from 10 Hz to 100 Hz. 1/f noise power spectral densities obey 1/f' frequency dependence, with gamma about to unity. The 1/f noise power spectrum at bias current of 5.4 mu A and frequency of 20 Hz is 4 x 10(-15) V-2/Hz. The result proves that new vanadium tungsten oxide is a strong candidate of thermometric materials for thermal imaging applications. (c) 2006 Elsevier B.V. All rights reserved. English ELSEVIER SILICON Excess noise in vanadium tungsten oxide bolometric material Article 10.1016/j.infrared.2006.06.032 1 INFRARED PHYSICS & TECHNOLOGY, v.50, no.1, pp.38 - 41 INFRARED PHYSICS & TECHNOLOGY 50 1 38 41 scie scopus 000245641200006 2-s2.0-33847405819 Instruments & Instrumentation Optics Physics, Applied Instruments & Instrumentation Optics Physics Article SILICON vanadium tungsten oxide vanadium tungsten alloy excess noise low-frequency noise