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<dcvalue element="contributor" qualifier="author">Gujar,&#x20;T.&#x20;P.</dcvalue>
<dcvalue element="contributor" qualifier="author">Shinde,&#x20;V.&#x20;R.</dcvalue>
<dcvalue element="contributor" qualifier="author">Lokhande,&#x20;C.&#x20;D.</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Woo-Young</dcvalue>
<dcvalue element="contributor" qualifier="author">Jung,&#x20;Kwang-Deog</dcvalue>
<dcvalue element="contributor" qualifier="author">Joo,&#x20;Oh-Shim</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T01:31:56Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T01:31:56Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-08-31</dcvalue>
<dcvalue element="date" qualifier="issued">2007-03</dcvalue>
<dcvalue element="identifier" qualifier="issn">1388-2481</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;134623</dcvalue>
<dcvalue element="description" qualifier="abstract">The&#x20;structural,&#x20;surface&#x20;morphological&#x20;and&#x20;optical&#x20;properties&#x20;of&#x20;sprayed&#x20;ruthenium&#x20;oxide&#x20;thin&#x20;film&#x20;were&#x20;investigated&#x20;using&#x20;XRD,&#x20;SEM&#x20;and&#x20;optical&#x20;absorption&#x20;measurements.&#x20;The&#x20;structural&#x20;analysis&#x20;from&#x20;XRD&#x20;pattern&#x20;showed&#x20;the&#x20;formation&#x20;of&#x20;RuO2&#x20;in&#x20;amorphous&#x20;phase.&#x20;The&#x20;scanning&#x20;electron&#x20;micrographs&#x20;revealed&#x20;network-like&#x20;morphology&#x20;of&#x20;ruthenium&#x20;oxide.&#x20;The&#x20;optical&#x20;studies&#x20;showed&#x20;a&#x20;direct&#x20;band&#x20;gap&#x20;of&#x20;2.4&#x20;eV&#x20;for&#x20;ruthenium&#x20;oxide&#x20;films.&#x20;Ruthenium&#x20;oxide&#x20;thin&#x20;film&#x20;exhibited&#x20;a&#x20;cyclic&#x20;voltammogram&#x20;indicative&#x20;high&#x20;reversibility&#x20;of&#x20;a&#x20;typical&#x20;capacitive&#x20;behavior&#x20;in&#x20;0.5&#x20;M&#x20;H2SO4&#x20;electrolyte.&#x20;A&#x20;specific&#x20;capacitance&#x20;of&#x20;551&#x20;F&#x2F;g&#x20;was&#x20;obtained&#x20;with&#x20;ruthenium&#x20;oxide&#x20;thin&#x20;film&#x20;(electrode)&#x20;prepared&#x20;by&#x20;spray&#x20;pyrolysis&#x20;method.&#x20;The&#x20;specific&#x20;capacitances&#x20;of&#x20;551&#x20;and&#x20;450&#x20;F&#x2F;g&#x20;at&#x20;the&#x20;scan&#x20;rate&#x20;of&#x20;5&#x20;and&#x20;125&#x20;mV&#x2F;s,&#x20;respectively,&#x20;indicate&#x20;that&#x20;the&#x20;capacitance&#x20;value&#x20;varies&#x20;inversely&#x20;with&#x20;scan&#x20;rate.&#x20;(c)&#x20;2006&#x20;Elsevier&#x20;B.V.&#x20;All&#x20;rights&#x20;reserved.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">ELSEVIER&#x20;SCIENCE&#x20;INC</dcvalue>
<dcvalue element="subject" qualifier="none">HYDROUS&#x20;RUTHENIUM&#x20;OXIDE</dcvalue>
<dcvalue element="subject" qualifier="none">CYCLIC&#x20;VOLTAMMETRIC&#x20;DEPOSITION</dcvalue>
<dcvalue element="subject" qualifier="none">ELECTRODE&#x20;MATERIAL</dcvalue>
<dcvalue element="subject" qualifier="none">FILM&#x20;ELECTRODES</dcvalue>
<dcvalue element="subject" qualifier="none">CAPACITORS</dcvalue>
<dcvalue element="title" qualifier="none">Spray&#x20;deposited&#x20;amorphous&#x20;RUO2&#x20;for&#x20;an&#x20;effective&#x20;use&#x20;in&#x20;electrochemical&#x20;supercapacitor</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1016&#x2F;j.elecom.2006.10.017</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">ELECTROCHEMISTRY&#x20;COMMUNICATIONS,&#x20;v.9,&#x20;no.3,&#x20;pp.504&#x20;-&#x20;510</dcvalue>
<dcvalue element="citation" qualifier="title">ELECTROCHEMISTRY&#x20;COMMUNICATIONS</dcvalue>
<dcvalue element="citation" qualifier="volume">9</dcvalue>
<dcvalue element="citation" qualifier="number">3</dcvalue>
<dcvalue element="citation" qualifier="startPage">504</dcvalue>
<dcvalue element="citation" qualifier="endPage">510</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000245478400028</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-33847641392</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Electrochemistry</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Electrochemistry</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">HYDROUS&#x20;RUTHENIUM&#x20;OXIDE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">CYCLIC&#x20;VOLTAMMETRIC&#x20;DEPOSITION</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ELECTRODE&#x20;MATERIAL</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">FILM&#x20;ELECTRODES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">CAPACITORS</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">ruthenium&#x20;oxide</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">thin&#x20;films</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">spray&#x20;deposition</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">surface&#x20;morphology</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">optical&#x20;properties</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">supercapacitor</dcvalue>
</dublin_core>
