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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Kang,&#x20;KyongTae</dcvalue>
<dcvalue element="contributor" qualifier="author">Lim,&#x20;Mi-Hwa</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Ho-Gi</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;Il-Doo</dcvalue>
<dcvalue element="contributor" qualifier="author">Hong,&#x20;Jae-Min</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T01:34:29Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T01:34:29Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-04</dcvalue>
<dcvalue element="date" qualifier="issued">2007-01-22</dcvalue>
<dcvalue element="identifier" qualifier="issn">0003-6951</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;134728</dcvalue>
<dcvalue element="description" qualifier="abstract">The&#x20;authors&#x20;report&#x20;on&#x20;the&#x20;influence&#x20;of&#x20;Mg&#x20;acceptor&#x20;doping&#x20;on&#x20;the&#x20;markedly&#x20;reduced&#x20;leakage&#x20;current&#x20;characteristics&#x20;(&lt;&#x20;5x10(-8)&#x20;A&#x2F;cm(2)&#x20;at&#x20;2&#x20;MV&#x2F;cm)&#x20;of&#x20;Ba0.6Sr0.4TiO3&#x20;thin&#x20;films.&#x20;The&#x20;suitability&#x20;of&#x20;room&#x20;temperature&#x20;deposited&#x20;Mg-doped&#x20;Ba0.6Sr0.4TiO3&#x20;films&#x20;as&#x20;gate&#x20;insulators&#x20;for&#x20;low-voltage&#x20;ZnO&#x20;thin-film&#x20;transistors&#x20;(TFTs)&#x20;(&lt;&#x20;6&#x20;V)&#x20;was&#x20;investigated.&#x20;All&#x20;room&#x20;temperature&#x20;processed&#x20;ZnO-TFTs&#x20;on&#x20;plastic&#x20;substrates&#x20;exhibited&#x20;a&#x20;high&#x20;field-effect&#x20;mobility&#x20;of&#x20;16.3&#x20;cm(2)&#x2F;V&#x20;s&#x20;and&#x20;a&#x20;current&#x20;on&#x2F;off&#x20;ratio&#x20;of&#x20;6.4x10(4).&#x20;The&#x20;threshold&#x20;voltage&#x20;and&#x20;subthreshold&#x20;swing&#x20;were&#x20;2.8&#x20;V&#x20;and&#x20;400&#x20;mV&#x2F;decade,&#x20;respectively.&#x20;(c)&#x20;2007&#x20;American&#x20;Institute&#x20;of&#x20;Physics.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">AMER&#x20;INST&#x20;PHYSICS</dcvalue>
<dcvalue element="subject" qualifier="none">VOLTAGE&#x20;ORGANIC&#x20;TRANSISTORS</dcvalue>
<dcvalue element="subject" qualifier="none">POLYMER&#x20;SUBSTRATE</dcvalue>
<dcvalue element="title" qualifier="none">High&#x20;field-effect&#x20;mobility&#x20;ZnO&#x20;thin-film&#x20;transistors&#x20;with&#x20;Mg-doped&#x20;Ba0.6Sr0.4TiO3&#x20;gate&#x20;insulator&#x20;on&#x20;plastic&#x20;substrates</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1063&#x2F;1.2434150</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">APPLIED&#x20;PHYSICS&#x20;LETTERS,&#x20;v.90,&#x20;no.4</dcvalue>
<dcvalue element="citation" qualifier="title">APPLIED&#x20;PHYSICS&#x20;LETTERS</dcvalue>
<dcvalue element="citation" qualifier="volume">90</dcvalue>
<dcvalue element="citation" qualifier="number">4</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000243789600102</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-33846623831</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">VOLTAGE&#x20;ORGANIC&#x20;TRANSISTORS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">POLYMER&#x20;SUBSTRATE</dcvalue>
</dublin_core>
