<?xml version="1.0" encoding="utf-8" standalone="no"?>
<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Noh&#x20;Hae-Yong</dcvalue>
<dcvalue element="contributor" qualifier="author">Jee&#x20;Kwang-Koo</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee&#x20;Kyu-Hwan</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee&#x20;Young-Kook</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T02:03:12Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T02:03:12Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-08-31</dcvalue>
<dcvalue element="date" qualifier="issued">2006-12</dcvalue>
<dcvalue element="identifier" qualifier="issn">1001-0521</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;134944</dcvalue>
<dcvalue element="description" qualifier="abstract">Thin&#x20;film&#x20;of&#x20;Ti-Ni&#x20;alloy&#x20;has&#x20;a&#x20;potential&#x20;to&#x20;perform&#x20;the&#x20;microactuation&#x20;functions&#x20;required&#x20;in&#x20;the&#x20;microelectromechanical&#x20;system&#x20;(MEMS).&#x20;It&#x20;is&#x20;essential,&#x20;however,&#x20;to&#x20;have&#x20;good&#x20;uniformity&#x20;in&#x20;both&#x20;chemical&#x20;composition&#x20;and&#x20;thickness&#x20;to&#x20;realize&#x20;its&#x20;full&#x20;potential&#x20;as&#x20;an&#x20;active&#x20;component&#x20;of&#x20;MEMS&#x20;devices.&#x20;Electron&#x20;beam&#x20;evaporation&#x20;technique&#x20;was&#x20;employed&#x20;in&#x20;this&#x20;study&#x20;to&#x20;fabricate&#x20;the&#x20;thin&#x20;films&#x20;of&#x20;Ti-Ni&#x20;alloy&#x20;on&#x20;different&#x20;substrates.&#x20;The&#x20;targets&#x20;used&#x20;for&#x20;the&#x20;evaporation&#x20;were&#x20;first&#x20;prepared&#x20;by&#x20;electron&#x20;beam&#x20;melting.&#x20;The&#x20;uniformity&#x20;of&#x20;composition&#x20;and&#x20;microstructure&#x20;of&#x20;the&#x20;thin&#x20;films&#x20;were&#x20;characterized&#x20;by&#x20;electron&#x20;probe&#x20;microanalysis&#x20;(EPMA),&#x20;Auger&#x20;electron&#x20;spectroscopy&#x20;(AES),&#x20;X-ray&#x20;diffraction&#x20;(XRD),&#x20;scanning&#x20;electron&#x20;microscopy&#x20;(SEM),&#x20;atomic&#x20;force&#x20;microscopy&#x20;(AFM)&#x20;and&#x20;transmission&#x20;electron&#x20;microscopy&#x20;(TEM).&#x20;The&#x20;mechanical&#x20;property&#x20;of&#x20;the&#x20;thin&#x20;films&#x20;was&#x20;evaluated&#x20;by&#x20;the&#x20;nano-indentation&#x20;test.&#x20;The&#x20;martensitic&#x20;transformation&#x20;temperature&#x20;was&#x20;measured&#x20;by&#x20;differential&#x20;scanning&#x20;calorimetry&#x20;(DSc).&#x20;It&#x20;is&#x20;confirmed&#x20;that&#x20;the&#x20;chemical&#x20;composition&#x20;of&#x20;deposited&#x20;thin&#x20;films&#x20;is&#x20;identical&#x20;to&#x20;that&#x20;of&#x20;the&#x20;target&#x20;materials.&#x20;Furthermore,&#x20;results&#x20;from&#x20;depth&#x20;profiling&#x20;of&#x20;the&#x20;chemical&#x20;composition&#x20;variation&#x20;reveal&#x20;that&#x20;the&#x20;electron&#x20;beam&#x20;evaporation&#x20;process&#x20;yields&#x20;better&#x20;compositional&#x20;homogeneity&#x20;than&#x20;other&#x20;conventional&#x20;methods&#x20;such&#x20;as&#x20;sputtering&#x20;and&#x20;thermal&#x20;evaporation.&#x20;Microstructural&#x20;observation&#x20;by&#x20;TEM&#x20;shows&#x20;that&#x20;nanometer&#x20;size&#x20;precipitates&#x20;are&#x20;preferentially&#x20;distributed&#x20;along&#x20;the&#x20;grain&#x20;boundaries&#x20;of&#x20;a&#x20;few&#x20;micron&#x20;size&#x20;grains.&#x20;The&#x20;hardness&#x20;and&#x20;elastic&#x20;modulus&#x20;of&#x20;thin&#x20;films&#x20;decreases&#x20;with&#x20;an&#x20;increase&#x20;in&#x20;Ti&#x20;contents.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">NONFERROUS&#x20;METALS&#x20;SOC&#x20;CHINA</dcvalue>
<dcvalue element="subject" qualifier="none">EVAPORATION</dcvalue>
<dcvalue element="title" qualifier="none">Electron&#x20;beam&#x20;deposition&#x20;and&#x20;characterization&#x20;of&#x20;thin&#x20;film&#x20;Ti-Ni&#x20;for&#x20;shape&#x20;memory&#x20;applications</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1016&#x2F;S1001-0521(08)60089-3</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">RARE&#x20;METALS,&#x20;v.25,&#x20;pp.237&#x20;-&#x20;242</dcvalue>
<dcvalue element="citation" qualifier="title">RARE&#x20;METALS</dcvalue>
<dcvalue element="citation" qualifier="volume">25</dcvalue>
<dcvalue element="citation" qualifier="startPage">237</dcvalue>
<dcvalue element="citation" qualifier="endPage">242</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000244766500049</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-42949151814</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Materials&#x20;Science,&#x20;Multidisciplinary</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Metallurgy&#x20;&amp;&#x20;Metallurgical&#x20;Engineering</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Materials&#x20;Science</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Metallurgy&#x20;&amp;&#x20;Metallurgical&#x20;Engineering</dcvalue>
<dcvalue element="type" qualifier="docType">Article;&#x20;Proceedings&#x20;Paper</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">EVAPORATION</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">electron&#x20;beam&#x20;evaporation</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">TiNiSMA&#x20;thin&#x20;film</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">martensitic&#x20;transformation</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">reverse&#x20;martensitic&#x20;transformation</dcvalue>
</dublin_core>
