Shin, J. W. Lee, J. Y. No, Y. S. Kim, T. W. Choi, W. K. 2024-01-21T02:36:26Z 2024-01-21T02:36:26Z 2021-09-01 2006-07-01 0021-8979 https://pubs.kist.re.kr/handle/201004/135340 X-ray diffraction patterns showed that crystallinity of the annealed ZnO films was improved by thermal annealing. Transmission electron microscopy images showed that columnar structures were preferentially formed in ZnO thin films due to thermal annealing, and electron energy loss spectroscopy images showed that annealing caused O-2 atoms to diffuse out from the upper region in the ZnO thin film. The effects of thermal treatment on the formation of the columnar structures in ZnO thin films grown on Si (100) substrates are described on the basis of the experimental results. (c) 2006 American Institute of Physics. English AMER INST PHYSICS PHOTOLUMINESCENCE DEPENDENCE ORIGIN Effects of thermal treatment on the formation of the columnar structures in ZnO thin films grown on p-Si(100) substrates Article 10.1063/1.2214366 1 JOURNAL OF APPLIED PHYSICS, v.100, no.1 JOURNAL OF APPLIED PHYSICS 100 1 scie scopus 000239056400043 2-s2.0-33746211157 Physics, Applied Physics Article PHOTOLUMINESCENCE DEPENDENCE ORIGIN ZnO theraml treatment columnar structure