Park, Chul-Woo Park, Jun-Bum Park, Young-Soo Lee, Seung-Hun Shin, Hyun-Jun Bae, Byung-Seong Moon, Sung 2024-01-21T03:00:50Z 2024-01-21T03:00:50Z 2021-09-01 2006-07 0374-4884 https://pubs.kist.re.kr/handle/201004/135374 In this paper, we report the measured performance of an InGaAs avalanche photodiode (APD) Module fabricated for single-photon counting. We measured the dark current noise, the after-pulse noise, and the quantum efficiency of the single- photon detector for different temperatures. We then examined our single-photon source and detection system by measuring the coincident probability. From our measurement, we observed that the after-pulse effect of the APD at temperatures below 105 degrees C caused cascade noise build-up on the succeeding electrical signals. English KOREAN PHYSICAL SOC PHOTODIODES Single-photon counting in the 1550-nm wavelength region for quantum cryptography Article 1 JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.49, no.1, pp.111 - 114 JOURNAL OF THE KOREAN PHYSICAL SOCIETY 49 1 111 114 scie scopus kci ART001018024 000239073100017 2-s2.0-33747069406 Physics, Multidisciplinary Physics Article PHOTODIODES quantum cryptography single-photon detection single-photon counting module (SPCM) InGaAs avalanche photodiode