Chang, W King, AH Bowman, KJ 2024-01-21T03:01:34Z 2024-01-21T03:01:34Z 2021-08-31 2006-06-12 0003-6951 https://pubs.kist.re.kr/handle/201004/135401 Thermal effects on domain orientation in tetragonal lead zirconate titanate (PZT) and lead titanate (PT) have been investigated by using in situ x-ray diffraction with an area detector. In the case of a soft PZT, it is found that the texture parameter called multiples of a random distribution (MRD) initially increases with temperature up to approximately 100 degrees C and then falls to unity at temperatures approaching the Curie temperature, whereas the MRD of hard PZT and PT initially undergoes a smaller increase or no change. The relationship between the mechanical strain energy and domain wall mobility with temperature is discussed. (c) 2006 American Institute of Physics. English AMER INST PHYSICS LEAD-ZIRCONATE-TITANATE PZT CERAMICS TEXTURE Thermal effects on domain orientation of tetragonal piezoelectrics studied by in situ x-ray diffraction Article 10.1063/1.2213952 1 APPLIED PHYSICS LETTERS, v.88, no.24 APPLIED PHYSICS LETTERS 88 24 scie scopus 000238314800065 Physics, Applied Physics Article LEAD-ZIRCONATE-TITANATE PZT CERAMICS TEXTURE