Suh, MC Chung, HK Kim, SY Kwon, JH Chin, BD 2024-01-21T04:14:24Z 2024-01-21T04:14:24Z 2021-09-03 2005-09-15 0009-2614 https://pubs.kist.re.kr/handle/201004/136132 Rutherford backscattering spectroscopy was applied to investigate the diffusion of metals into polymeric light emitting layer by a continuous device operation. The change of substrate (indium/tin) signal as well as calcium penetration after device operation was conspicuous using pristine light emitting polymer, whereas annealed device above polymer's glass transition temperature indicated almost no migration of calcium. This can be a direct evidence of the molecular conformation and rigidity change of light emitting polymer.. which affects the degradation behavior by the metal diffusion into organic thin film. (c) 2005 Elsevier B.V. All rights reserved. English ELSEVIER SCIENCE BV ELECTROLUMINESCENT DEVICES DIODES INTERFACE INJECTION LAYERS Cathode diffusion and degradation mechanism of polymeric light emitting devices Article 10.1016/j.cplett.2005.07.082 1 CHEMICAL PHYSICS LETTERS, v.413, no.1-3, pp.205 - 209 CHEMICAL PHYSICS LETTERS 413 1-3 205 209 scie scopus 000231929400038 2-s2.0-24344463424 Chemistry, Physical Physics, Atomic, Molecular & Chemical Chemistry Physics Article ELECTROLUMINESCENT DEVICES DIODES INTERFACE INJECTION LAYERS OLED Rutherford Backscattering Spectroscopy Decay Mechanism Metal Diffusion