Kim, JY Kim, DW Jung, HS Hong, KS 2024-01-21T04:33:51Z 2024-01-21T04:33:51Z 2021-09-01 2005-09 0021-4922 https://pubs.kist.re.kr/handle/201004/136202 The structural and dielectric properties of Bi2Ti2O7-Zn2Nb2O7 solid-solution thin films were investigated using (Bi2-xZnx)(NbxTi2-x)O-7 (BZNT, 0.05 <= x <= 1.0) pyrochlore thin films prepared on platinized Si substrates by metalorganic decomposition (MOD) process. Thermal analysis and X-ray diffraction (XRD) results confirmed that the crystallization of the BZNT thin films started below 600 degrees C and was completed at approximately 750 degrees C. Broad ranges of single-phase solid-solutions based on cubic (Bi1.5Zn0.5)(Nb0.5Ti1.5)O-7 were observed with x values from 0.1 to 0.7. Compared with bulk ceramics, a restriction in the lattice shrinkage of BZNT thin films with-x values under 0.5 was apparent, which may have introduced internal stress in the thin films and eventually affected the dielectric properties of BZNT thin films. The BZNT thin films investigated had dielectric constants in the range of 142-242, and the maximum dielectric constant was 242 when x = 0.5. Room-temperature capacitance-voltage measurements at 1 MHz demonstrated a tunability of 30%, with a zero-bias tan 3 of 0.005. English JAPAN SOC APPLIED PHYSICS BISMUTH STRAIN CAPACITORS Voltage-tunable dielectric properties of pyrochlore Bi-Zn-Nb-Ti-O solid-solution thin films Article 10.1143/JJAP.44.6648 1 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, no.9A, pp.6648 - 6653 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 44 9A 6648 6653 scie scopus 000232260700056 Physics, Applied Physics Article BISMUTH STRAIN CAPACITORS pyrochlore metalorganic decomposition (MOD) dielectric properties tunability