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<dcvalue element="contributor" qualifier="author">Lee,&#x20;KS</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;IH</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee,&#x20;TS</dcvalue>
<dcvalue element="contributor" qualifier="author">Cheong,&#x20;B</dcvalue>
<dcvalue element="contributor" qualifier="author">Park,&#x20;JG</dcvalue>
<dcvalue element="contributor" qualifier="author">Ha,&#x20;JG</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;WM</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T04:34:46Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T04:34:46Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-03</dcvalue>
<dcvalue element="date" qualifier="issued">2005-08-01</dcvalue>
<dcvalue element="identifier" qualifier="issn">0257-8972</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;136219</dcvalue>
<dcvalue element="description" qualifier="abstract">An&#x20;metal&#x20;clusters&#x20;are&#x20;embedded&#x20;in&#x20;amorphous&#x20;Si&#x20;matrix&#x20;using&#x20;alternating&#x20;sputtering&#x20;method.&#x20;Although&#x20;the&#x20;nominal&#x20;thickness&#x20;of&#x20;Au&#x20;metal&#x20;layer&#x20;was&#x20;adjusted&#x20;as&#x20;small&#x20;as&#x20;1&#x20;nm,&#x20;the&#x20;resultant&#x20;microstructure&#x20;showed&#x20;the&#x20;Bruggeman&#x20;geometry&#x20;consisting&#x20;of&#x20;a&#x20;networked&#x20;An&#x20;clusters.&#x20;Using&#x20;the&#x20;thin&#x20;film&#x20;data&#x20;of&#x20;the&#x20;constituent&#x20;materials&#x20;An&#x20;and&#x20;Si,&#x20;the&#x20;optical&#x20;absorption&#x20;in&#x20;the&#x20;effective&#x20;medium&#x20;was&#x20;calculated,&#x20;and&#x20;the&#x20;effects&#x20;of&#x20;composite&#x20;geometry,&#x20;particle&#x20;size,&#x20;and&#x20;shape&#x20;distributions&#x20;were&#x20;analyzed.&#x20;Inhomogeneous&#x20;broadening&#x20;of&#x20;absorption&#x20;band&#x20;is&#x20;thought&#x20;to&#x20;be&#x20;most&#x20;significant&#x20;in&#x20;this&#x20;BG&#x20;geometric&#x20;sample,&#x20;but&#x20;the&#x20;remaining&#x20;discrepancy&#x20;between&#x20;the&#x20;calculated&#x20;and&#x20;the&#x20;measured&#x20;absorption&#x20;may&#x20;be&#x20;ascribed&#x20;to&#x20;the&#x20;presence&#x20;of&#x20;energy&#x20;dissipation&#x20;process&#x20;due&#x20;to&#x20;a&#x20;finite&#x20;Schottky&#x20;barrier&#x20;built&#x20;up&#x20;at&#x20;the&#x20;metal-semi&#x20;conductor&#x20;junction.&#x20;(c)&#x20;2004&#x20;Elsevier&#x20;B.V.&#x20;All&#x20;rights&#x20;reserved.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">ELSEVIER&#x20;SCIENCE&#x20;SA</dcvalue>
<dcvalue element="subject" qualifier="none">OPTICAL-PROPERTIES</dcvalue>
<dcvalue element="subject" qualifier="none">METAL&#x20;NANOCLUSTERS</dcvalue>
<dcvalue element="subject" qualifier="none">ABSORPTION</dcvalue>
<dcvalue element="subject" qualifier="none">PARTICLES</dcvalue>
<dcvalue element="title" qualifier="none">Dielectric&#x20;confinement&#x20;and&#x20;surface&#x20;plasmon&#x20;damping&#x20;in&#x20;Au:&#x20;Semiconductor&#x20;nanocomposite&#x20;thin&#x20;films</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1016&#x2F;j.surfcoat.2004.10.062</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">SURFACE&#x20;&amp;&#x20;COATINGS&#x20;TECHNOLOGY,&#x20;v.198,&#x20;no.1-3,&#x20;pp.51&#x20;-&#x20;54</dcvalue>
<dcvalue element="citation" qualifier="title">SURFACE&#x20;&amp;&#x20;COATINGS&#x20;TECHNOLOGY</dcvalue>
<dcvalue element="citation" qualifier="volume">198</dcvalue>
<dcvalue element="citation" qualifier="number">1-3</dcvalue>
<dcvalue element="citation" qualifier="startPage">51</dcvalue>
<dcvalue element="citation" qualifier="endPage">54</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000230419400011</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-20744437455</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Materials&#x20;Science,&#x20;Coatings&#x20;&amp;&#x20;Films</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Materials&#x20;Science</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article;&#x20;Proceedings&#x20;Paper</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">OPTICAL-PROPERTIES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">METAL&#x20;NANOCLUSTERS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ABSORPTION</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">PARTICLES</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">surface&#x20;plasmon</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">metal&#x20;nanocluster</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">sputtering</dcvalue>
</dublin_core>
