Lee, HJ Moon, SI Kim, JK Lee, YD Nahm, S Yoo, JE Han, JH Lee, YH Hwang, SW Ju, BK 2024-01-21T04:38:39Z 2024-01-21T04:38:39Z 2021-09-03 2005-07-01 0021-8979 https://pubs.kist.re.kr/handle/201004/136291 By applying a critical bias field instead of conventional surface treatments, the electron emission properties of screen-printed nanotubes were investigated through scanning electron. microscopy and emission current-voltage characteristics. After the surface treatment, at the bias field of 2.5 V/mu m, the electron emission current density with good uniform emission sites reached the value of 2.13 mA/cm(2) which was 400 times higher than that of the untreated sample, and the turn-on voltage decreased markedly from 700 to 460 V. In addition, the enhancement of the alignment of carbon nanotubes to the vertical direction was observed, resulting in an increase. in-the field-enhancement factor. (c) 2005 American Institute of Physics. English AMER INST PHYSICS EMITTERS Improvement of field emission from printed carbon nanotubes by a critical bias field Article 10.1063/1.1953889 1 JOURNAL OF APPLIED PHYSICS, v.98, no.1 JOURNAL OF APPLIED PHYSICS 98 1 scie scopus 000231062200128 2-s2.0-22944465082 Physics, Applied Physics Article EMITTERS field emission carbon nanotube