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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Shim,&#x20;SI</dcvalue>
<dcvalue element="contributor" qualifier="author">Kwon,&#x20;YS</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;SI</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;YT</dcvalue>
<dcvalue element="contributor" qualifier="author">Park,&#x20;JH</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T05:32:14Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T05:32:14Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-03</dcvalue>
<dcvalue element="date" qualifier="issued">2005-03</dcvalue>
<dcvalue element="identifier" qualifier="issn">0038-1101</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;136715</dcvalue>
<dcvalue element="description" qualifier="abstract">Metal-ferroelectric-insulator-semiconductor&#x20;field-effect&#x20;transistor&#x20;(MFISFET)&#x20;with&#x20;Pt-SrBi2Ta2O9&#x20;(SBT)-Y2O3-Si&#x20;gate&#x20;structure&#x20;was&#x20;fabricated&#x20;with&#x20;a&#x20;selective&#x20;dry&#x20;etching&#x20;of&#x20;SBT&#x20;and&#x20;Y2O3.&#x20;The&#x20;etching&#x20;characteristics&#x20;of&#x20;SBT,&#x20;Y2O3,&#x20;and&#x20;silicon&#x20;were&#x20;investigated&#x20;with&#x20;various&#x20;Ar&#x2F;Cl-2&#x20;gas&#x20;mixing&#x20;ratios.&#x20;Inductively&#x20;coupled&#x20;plasma&#x20;(ICP)&#x20;Powers,&#x20;and&#x20;RF&#x20;bias&#x20;powers&#x20;and&#x20;the&#x20;surface&#x20;condition&#x20;after&#x20;the&#x20;etching&#x20;was&#x20;analyzed&#x20;by&#x20;using&#x20;the&#x20;scanning&#x20;electron&#x20;microscopy&#x20;(SEM),&#x20;atomic&#x20;force&#x20;microscopy&#x20;(AFM),&#x20;X-ray&#x20;photoemission&#x20;spectroscopy&#x20;(XPS),&#x20;and&#x20;Rutherford&#x20;back&#x20;scattering&#x20;(RBS)&#x20;measurement.&#x20;The&#x20;etch-stop&#x20;process&#x20;was&#x20;successfully&#x20;achieved&#x20;at&#x20;the&#x20;condition&#x20;of&#x20;50%&#x20;Cl-2&#x20;concentration&#x20;with&#x20;the&#x20;ICP&#x20;power&#x20;of&#x20;900&#x20;W&#x20;and&#x20;the&#x20;RF&#x20;bias&#x20;power&#x20;of&#x20;100&#x20;W&#x20;where&#x20;the&#x20;selectivity&#x20;of&#x20;SBT&#x20;to&#x20;Y2O3&#x20;was&#x20;4.&#x20;The&#x20;fabricated&#x20;MFISFET&#x20;with&#x20;the&#x20;etch-stop&#x20;process&#x20;showed&#x20;good&#x20;memory&#x20;operation&#x20;with&#x20;1.2&#x20;V&#x20;threshold&#x20;voltage&#x20;difference&#x20;and&#x20;more&#x20;than&#x20;three&#x20;orders&#x20;of&#x20;drain&#x20;current&#x20;difference&#x20;in&#x20;the&#x20;on&#x2F;off&#x20;drain&#x20;current&#x20;ratio&#x20;at&#x20;the&#x20;operating&#x20;voltage&#x20;of&#x20;7&#x20;V.&#x20;These&#x20;results&#x20;meant&#x20;that&#x20;the&#x20;etch-stop&#x20;process&#x20;was&#x20;successfully&#x20;carried&#x20;out&#x20;and&#x20;applied&#x20;to&#x20;MFISFET&#x20;fabrication&#x20;without&#x20;degradation&#x20;of&#x20;the&#x20;ferroelectric&#x20;characteristics&#x20;and&#x20;damage&#x20;on&#x20;silicon&#x20;surface.&#x20;(C)&#x20;2004&#x20;Elsevier&#x20;Ltd.&#x20;All&#x20;rights&#x20;reserved.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">PERGAMON-ELSEVIER&#x20;SCIENCE&#x20;LTD</dcvalue>
<dcvalue element="subject" qualifier="none">FERROELECTRIC&#x20;MEMORY</dcvalue>
<dcvalue element="subject" qualifier="none">THIN-FILMS</dcvalue>
<dcvalue element="subject" qualifier="none">SEMICONDUCTOR</dcvalue>
<dcvalue element="subject" qualifier="none">RETENTION</dcvalue>
<dcvalue element="subject" qualifier="none">VOLTAGE</dcvalue>
<dcvalue element="subject" qualifier="none">FET</dcvalue>
<dcvalue element="title" qualifier="none">Memory&#x20;operation&#x20;of&#x20;Pt-SrBi2Ta2O9-Y2O3-Si&#x20;field-effect&#x20;transistor&#x20;with&#x20;damage-free&#x20;selective&#x20;dry&#x20;etching&#x20;process</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1016&#x2F;j.sse.2004.11.015</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">SOLID-STATE&#x20;ELECTRONICS,&#x20;v.49,&#x20;no.3,&#x20;pp.497&#x20;-&#x20;504</dcvalue>
<dcvalue element="citation" qualifier="title">SOLID-STATE&#x20;ELECTRONICS</dcvalue>
<dcvalue element="citation" qualifier="volume">49</dcvalue>
<dcvalue element="citation" qualifier="number">3</dcvalue>
<dcvalue element="citation" qualifier="startPage">497</dcvalue>
<dcvalue element="citation" qualifier="endPage">504</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000226942300031</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-12344322860</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Engineering,&#x20;Electrical&#x20;&amp;&#x20;Electronic</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Condensed&#x20;Matter</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Engineering</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">FERROELECTRIC&#x20;MEMORY</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">THIN-FILMS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SEMICONDUCTOR</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">RETENTION</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">VOLTAGE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">FET</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">ferroclectric</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">ferroelectric&#x20;memory</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">field-effect&#x20;transistor</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">SBT</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">RIE</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">etch-stop</dcvalue>
</dublin_core>
