Han, JH Kim, DI Jee, KK Oh, KH 2024-01-21T05:43:12Z 2024-01-21T05:43:12Z 2021-09-05 2004-12-15 0921-5093 https://pubs.kist.re.kr/handle/201004/136914 The evolution of the surface relief and the crystallographic orientations were investigated in a pure aluminum single crystal during in situ uniaxial tensile deformation inside a scanning electron microscope using an electron backscattered diffraction (EBSD) system. The operative slip systems were determined from the EBSD measurement in the deformation bands. Domains of two types form during inhomogeneous deformation showing a different orientation rotation behavior developing with increasing strain. The formation of the domains is caused by the rotation of local crystal areas due to the intersection of the primary and secondary slip systems. (C) 2004 Elsevier B.V. All rights reserved. English ELSEVIER SCIENCE SA X-RAY-DIFFRACTION BEHAVIOR Evolution of crystallographic orientations in an aluminum single crystal during tensile deformation Article 10.1016/j.msea.2004.01.083 1 MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v.387, pp.60 - 63 MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING 387 60 63 scie scopus 000226042400013 2-s2.0-10644229098 Nanoscience & Nanotechnology Materials Science, Multidisciplinary Metallurgy & Metallurgical Engineering Science & Technology - Other Topics Materials Science Metallurgy & Metallurgical Engineering Article; Proceedings Paper X-RAY-DIFFRACTION BEHAVIOR single crystal EBSD in situ deformation in SEM orientation rotation deformation band