Kim, IS Kim, YT Kim, SI Yoo, DC Lee, JY 2024-01-21T06:03:17Z 2024-01-21T06:03:17Z 2021-09-05 2004-12 1862-6300 https://pubs.kist.re.kr/handle/201004/137001 We have investigated the hydrogen-induced lattice deformation of SrBi2Nb2O9 (SBN) films with high resolution transmission electron microscopy (HR-TEM) and fast Fourier transformation (FFT) analysis. The deformation of the lattice sites is originated from the Bi-oxide layer interface and shifted up and down by 0.92 Angstrom compared with the normal sites in the {115} planes. This distorted perovskite structure results in the hydrogen induced degradation of ferroelectric properties. However, this lattice deformation and the ferroelectric degradation of SBN films are recovered after annealing in oxygen ambient. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. English WILEY-V C H VERLAG GMBH TRANSMISSION ELECTRON-MICROSCOPY INDUCED DEGRADATION Lattice structural analysis of hydrogen induced defects in SrBi2Nb2O9 thin films Article 10.1002/pssa.200409075 1 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.201, no.15, pp.R123 - R126 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 201 15 R123 R126 scie scopus 000226038200002 2-s2.0-11444270811 Materials Science, Multidisciplinary Physics, Applied Physics, Condensed Matter Materials Science Physics Article TRANSMISSION ELECTRON-MICROSCOPY INDUCED DEGRADATION