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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Hwang,&#x20;HS</dcvalue>
<dcvalue element="contributor" qualifier="author">Oh,&#x20;SH</dcvalue>
<dcvalue element="contributor" qualifier="author">Kim,&#x20;HS</dcvalue>
<dcvalue element="contributor" qualifier="author">Cho,&#x20;WI</dcvalue>
<dcvalue element="contributor" qualifier="author">Cho,&#x20;BW</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee,&#x20;DY</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T06:05:33Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T06:05:33Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-04</dcvalue>
<dcvalue element="date" qualifier="issued">2004-11-30</dcvalue>
<dcvalue element="identifier" qualifier="issn">0013-4686</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;137042</dcvalue>
<dcvalue element="description" qualifier="abstract">The&#x20;effect&#x20;of&#x20;silver&#x20;co-sputtering&#x20;on&#x20;the&#x20;characteristics&#x20;of&#x20;amorphous&#x20;V2O5&#x20;films,&#x20;grown&#x20;by&#x20;dc&#x20;reactive&#x20;sputtering,&#x20;is&#x20;investigated.&#x20;The&#x20;co-sputtering&#x20;process&#x20;influences&#x20;the&#x20;growth&#x20;mechanism&#x20;as&#x20;well&#x20;as&#x20;the&#x20;characteristics&#x20;of&#x20;the&#x20;V2O5&#x20;films.&#x20;X-ray&#x20;diffraction&#x20;(XRD),&#x20;Inductively&#x20;coupled&#x20;plasma-atomic&#x20;emission&#x20;spectrometry&#x20;(ICP-AES),&#x20;field&#x20;emission-scanning&#x20;electron&#x20;microscopy&#x20;(FE-SEM),&#x20;Fourier&#x20;transform&#x20;infrared&#x20;spectrometry&#x20;(FT-IR)&#x20;and&#x20;X-ray&#x20;photoelectron&#x20;spectrometry&#x20;(XPS)&#x20;results&#x20;indicate&#x20;that&#x20;the&#x20;microstructure&#x20;of&#x20;the&#x20;V2O5&#x20;films&#x20;is&#x20;affected&#x20;by&#x20;the&#x20;rf&#x20;power&#x20;of&#x20;the&#x20;co-sputtered&#x20;silver.&#x20;In&#x20;addition,&#x20;an&#x20;all-solid-state&#x20;thin&#x20;film&#x20;battery&#x20;with&#x20;full&#x20;cell&#x20;structure&#x20;of&#x20;Li&#x2F;LiPON&#x2F;AgxV2O5&#x2F;Pt&#x20;has&#x20;been&#x20;fabricated.&#x20;It&#x20;is&#x20;found&#x20;that&#x20;the&#x20;silver&#x20;co-sputtered&#x20;V2O5&#x20;cathode&#x20;film&#x20;exhibits&#x20;better&#x20;cycle&#x20;performance&#x20;than&#x20;an&#x20;undoped&#x20;one.&#x20;(C)&#x20;2004&#x20;Elsevier&#x20;Ltd.&#x20;All&#x20;rights&#x20;reserved.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">PERGAMON-ELSEVIER&#x20;SCIENCE&#x20;LTD</dcvalue>
<dcvalue element="subject" qualifier="none">RECHARGEABLE&#x20;LITHIUM&#x20;BATTERIES</dcvalue>
<dcvalue element="subject" qualifier="none">MICROBATTERIES</dcvalue>
<dcvalue element="subject" qualifier="none">INTERCALATION</dcvalue>
<dcvalue element="subject" qualifier="none">INSERTION</dcvalue>
<dcvalue element="title" qualifier="none">Characterization&#x20;of&#x20;Ag-doped&#x20;vanadium&#x20;oxide&#x20;(AgxV2O5)&#x20;thin&#x20;film&#x20;for&#x20;cathode&#x20;of&#x20;thin&#x20;film&#x20;battery</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1016&#x2F;j.electacta.2004.04.050</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">ELECTROCHIMICA&#x20;ACTA,&#x20;v.50,&#x20;no.2-3,&#x20;pp.485&#x20;-&#x20;489</dcvalue>
<dcvalue element="citation" qualifier="title">ELECTROCHIMICA&#x20;ACTA</dcvalue>
<dcvalue element="citation" qualifier="volume">50</dcvalue>
<dcvalue element="citation" qualifier="number">2-3</dcvalue>
<dcvalue element="citation" qualifier="startPage">485</dcvalue>
<dcvalue element="citation" qualifier="endPage">489</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000225261000047</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-9444227073</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Electrochemistry</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Electrochemistry</dcvalue>
<dcvalue element="type" qualifier="docType">Article;&#x20;Proceedings&#x20;Paper</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">RECHARGEABLE&#x20;LITHIUM&#x20;BATTERIES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">MICROBATTERIES</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">INTERCALATION</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">INSERTION</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">silver&#x20;co-sputtering</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">amorphous&#x20;vanadium&#x20;oxide</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">cathode</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">thin&#x20;film&#x20;battery</dcvalue>
</dublin_core>
