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<dublin_core schema="dc">
<dcvalue element="contributor" qualifier="author">Song,&#x20;SK</dcvalue>
<dcvalue element="contributor" qualifier="author">Koh,&#x20;SK</dcvalue>
<dcvalue element="contributor" qualifier="author">Lee,&#x20;DY</dcvalue>
<dcvalue element="contributor" qualifier="author">Song,&#x20;KM</dcvalue>
<dcvalue element="contributor" qualifier="author">Baik,&#x20;HK</dcvalue>
<dcvalue element="date" qualifier="accessioned">2024-01-21T06:34:03Z</dcvalue>
<dcvalue element="date" qualifier="available">2024-01-21T06:34:03Z</dcvalue>
<dcvalue element="date" qualifier="created">2021-09-05</dcvalue>
<dcvalue element="date" qualifier="issued">2004-09</dcvalue>
<dcvalue element="identifier" qualifier="issn">0021-4922</dcvalue>
<dcvalue element="identifier" qualifier="uri">https:&#x2F;&#x2F;pubs.kist.re.kr&#x2F;handle&#x2F;201004&#x2F;137284</dcvalue>
<dcvalue element="description" qualifier="abstract">A&#x20;model&#x20;for&#x20;the&#x20;electrical&#x20;conductance&#x20;of&#x20;a&#x20;semiconductive&#x20;substrate&#x20;with&#x20;an&#x20;average&#x20;thickness&#x20;is&#x20;proposed&#x20;for&#x20;a&#x20;region&#x20;of&#x20;initial&#x20;growth&#x20;before&#x20;the&#x20;appearance&#x20;of&#x20;a&#x20;tunneling&#x20;effect.&#x20;Based&#x20;on&#x20;this&#x20;model,&#x20;we&#x20;propose&#x20;6&#x20;different&#x20;growth&#x20;modes&#x20;according&#x20;to&#x20;the&#x20;film&#x20;thickness,&#x20;measuring&#x20;in&#x20;stitu&#x20;electrical&#x20;conductivity.&#x20;As&#x20;the&#x20;film&#x20;thickness&#x20;increased,&#x20;the&#x20;island&#x20;size&#x20;was&#x20;constant&#x20;and&#x20;then&#x20;increased,&#x20;while&#x20;the&#x20;number&#x20;of&#x20;islands&#x20;first&#x20;increased&#x20;and&#x20;then&#x20;decreased.&#x20;The&#x20;proposed&#x20;model&#x20;may&#x20;be&#x20;useful&#x20;for&#x20;in&#x20;situ&#x20;study&#x20;of&#x20;the&#x20;growth&#x20;of&#x20;ultrathin&#x20;films&#x20;prior&#x20;to&#x20;the&#x20;onset&#x20;of&#x20;tunneling&#x20;conductance.</dcvalue>
<dcvalue element="language" qualifier="none">English</dcvalue>
<dcvalue element="publisher" qualifier="none">JAPAN&#x20;SOC&#x20;APPLIED&#x20;PHYSICS</dcvalue>
<dcvalue element="subject" qualifier="none">INDIUM&#x20;TIN&#x20;OXIDE</dcvalue>
<dcvalue element="subject" qualifier="none">THIN-FILMS</dcvalue>
<dcvalue element="subject" qualifier="none">IN-SITU</dcvalue>
<dcvalue element="subject" qualifier="none">GROWING&#x20;FILMS</dcvalue>
<dcvalue element="subject" qualifier="none">METAL-FILMS</dcvalue>
<dcvalue element="subject" qualifier="none">DEPOSITION</dcvalue>
<dcvalue element="subject" qualifier="none">BEAM</dcvalue>
<dcvalue element="subject" qualifier="none">ELLIPSOMETRY</dcvalue>
<dcvalue element="subject" qualifier="none">SPECTROSCOPY</dcvalue>
<dcvalue element="subject" qualifier="none">TRANSITION</dcvalue>
<dcvalue element="title" qualifier="none">Modeling&#x20;and&#x20;initial&#x20;growth&#x20;mode&#x20;of&#x20;ultrathin&#x20;film&#x20;on&#x20;the&#x20;basis&#x20;of&#x20;electrical&#x20;conductivity&#x20;of&#x20;substrate</dcvalue>
<dcvalue element="type" qualifier="none">Article</dcvalue>
<dcvalue element="identifier" qualifier="doi">10.1143&#x2F;JJAP.43.6452</dcvalue>
<dcvalue element="description" qualifier="journalClass">1</dcvalue>
<dcvalue element="identifier" qualifier="bibliographicCitation">JAPANESE&#x20;JOURNAL&#x20;OF&#x20;APPLIED&#x20;PHYSICS&#x20;PART&#x20;1-REGULAR&#x20;PAPERS&#x20;BRIEF&#x20;COMMUNICATIONS&#x20;&amp;&#x20;REVIEW&#x20;PAPERS,&#x20;v.43,&#x20;no.9A,&#x20;pp.6452&#x20;-&#x20;6456</dcvalue>
<dcvalue element="citation" qualifier="title">JAPANESE&#x20;JOURNAL&#x20;OF&#x20;APPLIED&#x20;PHYSICS&#x20;PART&#x20;1-REGULAR&#x20;PAPERS&#x20;BRIEF&#x20;COMMUNICATIONS&#x20;&amp;&#x20;REVIEW&#x20;PAPERS</dcvalue>
<dcvalue element="citation" qualifier="volume">43</dcvalue>
<dcvalue element="citation" qualifier="number">9A</dcvalue>
<dcvalue element="citation" qualifier="startPage">6452</dcvalue>
<dcvalue element="citation" qualifier="endPage">6456</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scie</dcvalue>
<dcvalue element="description" qualifier="journalRegisteredClass">scopus</dcvalue>
<dcvalue element="identifier" qualifier="wosid">000224579000105</dcvalue>
<dcvalue element="identifier" qualifier="scopusid">2-s2.0-9144238403</dcvalue>
<dcvalue element="relation" qualifier="journalWebOfScienceCategory">Physics,&#x20;Applied</dcvalue>
<dcvalue element="relation" qualifier="journalResearchArea">Physics</dcvalue>
<dcvalue element="type" qualifier="docType">Article</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">INDIUM&#x20;TIN&#x20;OXIDE</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">THIN-FILMS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">IN-SITU</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">GROWING&#x20;FILMS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">METAL-FILMS</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">DEPOSITION</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">BEAM</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">ELLIPSOMETRY</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">SPECTROSCOPY</dcvalue>
<dcvalue element="subject" qualifier="keywordPlus">TRANSITION</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">electrical&#x20;conductance</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">initial&#x20;growth</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">6&#x20;different&#x20;growth&#x20;modes</dcvalue>
<dcvalue element="subject" qualifier="keywordAuthor">in&#x20;situ&#x20;electrical&#x20;conductivity</dcvalue>
</dublin_core>
