Choi, JJ Kim, DY Park, GT Kim, HE 2024-01-21T07:09:17Z 2024-01-21T07:09:17Z 2021-09-02 2004-05 0002-7820 https://pubs.kist.re.kr/handle/201004/137651 Lead lanthanum zirconate titanate (PLZT) thick films were deposited on a glass substrate using a methoxyethanol-based sol-gel multicoating method. Two types of electrodes, a coplanar surface electrode and an embedded electrode, were deposited on the films to measure the phase retardation of the PLZT films by the Senarmont method. The quadratic electrooptic properties were measured as a function of the film thickness, for thicknesses ranging from 1 to 4 mum. The PLZT film with the embedded electrode structure showed a higher phase retardation value and enhanced electric breakdown resistance. English AMER CERAMIC SOC THIN-FILMS CERAMICS Effect of electrode configuration on phase retardation of PLZT films grown on glass substrate Article 10.1111/j.1551-2916.2004.00950.x 1 JOURNAL OF THE AMERICAN CERAMIC SOCIETY, v.87, no.5, pp.950 - 952 JOURNAL OF THE AMERICAN CERAMIC SOCIETY 87 5 950 952 scie scopus 000221808100029 2-s2.0-3142693533 Materials Science, Ceramics Materials Science Article THIN-FILMS CERAMICS embedded electrode PLZT electrooptic retardation