이연희 2024-01-21T07:44:27Z 2024-01-21T07:44:27Z 2022-01-10 2003-12 https://pubs.kist.re.kr/handle/201004/138017 Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis 표면분석을 위한 비행시간형 이차이온질량분석법 (TOF-SIMS) Article 3 화학세계, v.12, pp.24 - 29 화학세계 12 24 29 TOF-SIMS surface analysis ion gun