Choi, JW Ha, JY Yoon, SJ Kim, HJ Yoon, KH 2024-01-21T08:14:51Z 2024-01-21T08:14:51Z 2021-09-01 2003-09 0955-2219 https://pubs.kist.re.kr/handle/201004/138300 The microwave dielectric characteristics of 0.75(Al1/2Ta1/2)O-2-0.25(Ti1-xSnx)O-2 ceramics were investigated. The microwave dielectric properties of 0.75(Al1/2Ta1/2)O-2-0.25TiO(2) sintered at 1450 degreesC exhibited a dielectric constant (epsilon(r)) of 31.2, a Q.f(0) of 54,590 GHz, and the temperature coefficient of resonant frequency (tau(f)) of +12.8 ppm/degreesC. To control of the tau(f) and enhance the Q.f(0) for 0.75(Al1/2Ta1/2)O-2-0.25TiO(2), Sn4+ was substituted for Ti4+. With an increase of Sri content from 5 to 50 mol%, the epsilon(r) slightly decreased, the Q.f(0) increased and the tau(f) shifted from positive to negative value. The tau(f) within +/-10 ppm/degreesC of zero was realized for the Sri content below 30 mol% and the microwave dielectric properties had the epsilon(r) value of 31.2-26.3, the Q.f(0) of 54,600-70,700 GHz, and tau(f) of +12.8--9.3 ppm/degreesC for this compositions. The relationship between microstructure and microwave dielectric characteristics was investigated. (C) 2003 Elsevier Ltd. All rights reserved. English ELSEVIER SCI LTD RESONATOR Microwave dielectric characteristics of 0.75(Al1/2Ta1/2)O-2-0.25(Ti1-xSnx)O-2 ceramics Article 10.1016/S0955-2219(03)00170-5 1 JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, v.23, no.14, pp.2507 - 2510 JOURNAL OF THE EUROPEAN CERAMIC SOCIETY 23 14 2507 2510 scie scopus 000185152600026 2-s2.0-0043192521 Materials Science, Ceramics Materials Science Article; Proceedings Paper RESONATOR dielectric constant microwave ceramics quality factor (Al,Ta)O-2 (Ti,Sn)O-2